Gerhard Meyer

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Adliswil, CH

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Patents Grantslast 30 patents

Information Patent Grant
Determination of local contact potential difference by noncontact a...
- Patent number 9,784,762
- Issue date Oct 10, 2017
- International Business Machines Corporation
- Leo Gross
- G01 - MEASURING TESTING
Information Patent Grant
Determination of local contact potential difference by noncontact a...
- Patent number 9,316,668
- Issue date Apr 19, 2016
- International Business Machines Corporation
- Leo Gross
- G01 - MEASURING TESTING
Information Patent Grant
Defining a pattern on a substrate
- Patent number 7,847,926
- Issue date Dec 7, 2010
- International Business Machines Corporation
- Gerhard Meyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defining a pattern on a substrate
- Patent number 7,315,367
- Issue date Jan 1, 2008
- International Business Machines Corporation
- Gerhard Meyer
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DETERMATION OF LOCAL CONTACT POTENTIAL DIFFERENCE BY NONCONTACT ATO...
- Publication number 20160223583
- Publication date Aug 4, 2016
- International Business Machines Corporation
- Leo Gross
- G01 - MEASURING TESTING
Information Patent Application
DETERMATION OF LOCAL CONTACT POTENTIAL DIFFERENCE BY NONCONTACT ATO...
- Publication number 20150121576
- Publication date Apr 30, 2015
- International Business Machines Corporation
- Leo Gross
- G01 - MEASURING TESTING
Information Patent Application
DEFINING A PATTERN ON A SUBSTRATE
- Publication number 20080074656
- Publication date Mar 27, 2008
- Gerhard Meyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Defining a pattern on a substrate
- Publication number 20050280792
- Publication date Dec 22, 2005
- International Business Machines Corporation
- Gerhard Meyer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY