Gerhard Poeppel

Person

Regensburg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Predictive chip-maintenance
- Patent number 11,531,056
- Issue date Dec 20, 2022
- Infineon Technologies AG
- Irmgard Escher-Poeppel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of reducing a sheet resistance in an electronic device, and...
- Patent number 10,573,533
- Issue date Feb 25, 2020
- Infineon Technologies AG
- Edward Fuergut
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor arrangement for particle analysis and a method for particle...
- Patent number 10,209,212
- Issue date Feb 19, 2019
- Infineon Technologies AG
- Guenther Ruhl
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for the computer-aided determination of deviati...
- Patent number 9,970,983
- Issue date May 15, 2018
- Infineon Technologies AG
- Reinhard Schachtner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for determination of gas concentration
- Patent number 9,201,007
- Issue date Dec 1, 2015
- Infineon Technologies AG
- Dieter Kohlert
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 8,394,673
- Issue date Mar 12, 2013
- Infineon Technologies AG
- Gerhard Josef Poeppel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device
- Patent number 8,169,070
- Issue date May 1, 2012
- Infineon Technologies AG
- Gerhard Josef Poeppel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device
- Patent number 8,035,224
- Issue date Oct 11, 2011
- Infineon Technologies AG
- Gerhard Josef Poeppel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spin device
- Patent number 7,974,120
- Issue date Jul 5, 2011
- Infineon Technologies AG
- Gerhard Poeppel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of making discrete trap memory (DTM) mediated by fullerenes
- Patent number 7,847,325
- Issue date Dec 7, 2010
- Infineon Technologies AG
- Gerhard Poeppel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for fault analysis in wafer production
- Patent number 6,847,855
- Issue date Jan 25, 2005
- Infineon Technologies AG
- Gerhard Poeppel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PREDICTIVE CHIP-MAINTENANCE
- Publication number 20210325445
- Publication date Oct 21, 2021
- INFINEON TECHNOLOGIES AG
- Irmgard Escher-Poeppel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF REDUCING A SHEET RESISTANCE IN AN ELECTRONIC DEVICE, AND...
- Publication number 20190013210
- Publication date Jan 10, 2019
- INFINEON TECHNOLOGIES AG
- Edward FUERGUT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR ARRANGEMENT FOR PARTICLE ANALYSIS AND A METHOD FOR PARTICLE...
- Publication number 20170234822
- Publication date Aug 17, 2017
- INFINEON TECHNOLOGIES AG
- Guenther RUHL
- G01 - MEASURING TESTING
Information Patent Application
Method of reducing a sheet resistance in an electronic device, and...
- Publication number 20160336226
- Publication date Nov 17, 2016
- INFINEON TECHNOLOGIES AG
- Edward FUERGUT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND DEVICES FOR THE COMPUTER-AIDED DETERMINATION OF DEVIATI...
- Publication number 20150219715
- Publication date Aug 6, 2015
- INFINEON TECHNOLOGIES AG
- Reinhard Schachtner
- G01 - MEASURING TESTING
Information Patent Application
Device for Determination of Gas Concentration
- Publication number 20130258315
- Publication date Oct 3, 2013
- INFINEON TECHNOLOGIES AG
- Dieter Kohlert
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20100289095
- Publication date Nov 18, 2010
- INFINEON TECHNOLOGIES AG
- Gerhard Josef Poeppel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Spin Device
- Publication number 20100188905
- Publication date Jul 29, 2010
- Gerhard Poeppel
- B82 - NANO-TECHNOLOGY
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20100123217
- Publication date May 20, 2010
- INFINEON TECHNOLOGIES AG
- Gerhard Josef Poeppel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Discrete Trap Memory (DTM) Mediated by Fullerenes
- Publication number 20090176358
- Publication date Jul 9, 2009
- Gerhard Poeppel
- G11 - INFORMATION STORAGE
Information Patent Application
Discrete Trap Memory (DTM) Mediated by Fullerenes
- Publication number 20080296662
- Publication date Dec 4, 2008
- Gerhard Poeppel
- G11 - INFORMATION STORAGE
Information Patent Application
Method for fault analysis in wafer production
- Publication number 20030148547
- Publication date Aug 7, 2003
- Infineon Technologies AG
- Gerhard Poeppel
- G01 - MEASURING TESTING

Gerhard Poeppel

Person

Patents Grantslast 30 patents

Predictive chip-maintenance

Method of reducing a sheet resistance in an electronic device, and...

Sensor arrangement for particle analysis and a method for particle...

Methods and devices for the computer-aided determination of deviati...

Device for determination of gas concentration

Semiconductor device

Semiconductor device

Semiconductor device

Spin device

Method of making discrete trap memory (DTM) mediated by fullerenes

Method for fault analysis in wafer production

Patents Applicationslast 30 patents

PREDICTIVE CHIP-MAINTENANCE

METHOD OF REDUCING A SHEET RESISTANCE IN AN ELECTRONIC DEVICE, AND...

SENSOR ARRANGEMENT FOR PARTICLE ANALYSIS AND A METHOD FOR PARTICLE...

Method of reducing a sheet resistance in an electronic device, and...

METHODS AND DEVICES FOR THE COMPUTER-AIDED DETERMINATION OF DEVIATI...

Device for Determination of Gas Concentration

SEMICONDUCTOR DEVICE

Spin Device

SEMICONDUCTOR DEVICE

Discrete Trap Memory (DTM) Mediated by Fullerenes

Discrete Trap Memory (DTM) Mediated by Fullerenes

Method for fault analysis in wafer production