Gerhard Weiss

Person

Weyhe, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Ion-optical phase volume compression
- Patent number 7,276,688
- Issue date Oct 2, 2007
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometers with orthogonal ion injection
- Patent number 7,223,966
- Issue date May 29, 2007
- Bruker Daltonik, GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RF quadrupole systems with potential gradients
- Patent number 7,164,125
- Issue date Jan 16, 2007
- Bruker Deltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Travelling field for packaging ion beams
- Patent number 7,151,255
- Issue date Dec 19, 2006
- Bruker Daltonik GmbH
- Gerhard Weiss
- F24 - HEATING RANGES VENTILATING
Information Patent Grant
Pulsers for time-of-flight mass spectrometers with orthogonal ion i...
- Patent number 6,903,332
- Issue date Jun 7, 2005
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sampler for dust on surfaces
- Patent number 6,898,991
- Issue date May 31, 2005
- Bruker Daltonik GmbH
- Ulrich Geise
- G01 - MEASURING TESTING
Information Patent Grant
Nonlinear resonance ejection from linear ion traps
- Patent number 6,831,275
- Issue date Dec 14, 2004
- Bruker Daltonik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact very high resolution time-of flight mass spectrometer
- Patent number 6,828,553
- Issue date Dec 7, 2004
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Travelling field for packaging ion beams
- Patent number 6,693,276
- Issue date Feb 17, 2004
- Bruker Daltonik GmbH
- Gerhard Weiss
- F24 - HEATING RANGES VENTILATING
Information Patent Grant
Ion trap mass spectrometer of high mass-constancy
- Patent number 6,133,568
- Issue date Oct 17, 2000
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility spectrometer with switchable electrodes
- Patent number 6,107,624
- Issue date Aug 22, 2000
- Bruker Saxonia Analytik GmbH
- Hans-Rudiger Doring
- G01 - MEASURING TESTING
Information Patent Grant
Ion mobility spectrometer in a centripetal arrangement
- Patent number 6,100,521
- Issue date Aug 8, 2000
- Bruker Saxonia Analytik GmbH
- Hans-Rudiger Doring
- G01 - MEASURING TESTING
Information Patent Grant
Sampling device comprising a revolvable sampling wheel with a metal...
- Patent number 5,437,203
- Issue date Aug 1, 1995
- Bruker Franzen Analytik GmbH
- Dieter Koch
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Inlet valve for a high-vacuum analyzer with bypass evacuation
- Patent number 5,404,765
- Issue date Apr 11, 1995
- Bruker-Franzen Analytik GmbH
- Gerhard Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for in-phase measuring of ions from ion trap mass...
- Patent number 5,386,113
- Issue date Jan 31, 1995
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for generating ions from thermally unstable, n...
- Patent number 5,294,797
- Issue date Mar 15, 1994
- Bruker Franzen Analytik GmbH
- Ruediger Frey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for mass-spectroscopic examination of a gas mixture and mass...
- Patent number 5,028,777
- Issue date Jul 2, 1991
- Bruker Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and instrument for mass analyzing samples with a quistor
- Patent number 4,975,577
- Issue date Dec 4, 1990
- The United States of America as represented by the Secretary of the Army
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of mass analyzing a sample by use of a quistor
- Patent number 4,882,484
- Issue date Nov 21, 1989
- The United States of America as represented by the Secretary of the Army
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 4,230,943
- Issue date Oct 28, 1980
- Dr. Franzen Analysentechnik GmbH & Co. Kommanditgesellschaft
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization chamber for chemical ionization
- Patent number 4,220,545
- Issue date Sep 2, 1980
- Dr. Franzen Analysentechnik GmbH & Co. Kommanditgesellschaft
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a mass filter analyzer system and analyzer sys...
- Patent number 4,213,557
- Issue date Jul 22, 1980
- Dr. Franzen Analysentechnik GmbH & Co. Kommanditgesellschaft
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Ion-optical phase volume compression
- Publication number 20050274902
- Publication date Dec 15, 2005
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF quadrupole systems with potential gradients
- Publication number 20050274887
- Publication date Dec 15, 2005
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DC voltage supply to RF electrode systems
- Publication number 20050269517
- Publication date Dec 8, 2005
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Travelling field for packaging ion beams
- Publication number 20050109933
- Publication date May 26, 2005
- Gerhard Weiss
- F24 - HEATING RANGES VENTILATING
Information Patent Application
Compact very high resolution time-of-flight mass spectrometer
- Publication number 20040144919
- Publication date Jul 29, 2004
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nonlinear resonance ejection from linear ion traps
- Publication number 20040051036
- Publication date Mar 18, 2004
- Bruker Daltonik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pulsers for time-of-flight mass spectrometers with orthogonal ion i...
- Publication number 20030168590
- Publication date Sep 11, 2003
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-flight mass spectrometers with orthogonal ion injection
- Publication number 20030136903
- Publication date Jul 24, 2003
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sampler for dust on surfaces
- Publication number 20030096428
- Publication date May 22, 2003
- Bruker Daltonik GmbH
- Ulrich Geise
- G01 - MEASURING TESTING
Information Patent Application
Travelling field for packaging ion beams
- Publication number 20020148959
- Publication date Oct 17, 2002
- Bruker Daltonik GmbH
- Gerhard Weiss
- F24 - HEATING RANGES VENTILATING

Gerhard Weiss

Person

Patents Grantslast 30 patents

Ion-optical phase volume compression

Time-of-flight mass spectrometers with orthogonal ion injection

RF quadrupole systems with potential gradients

Travelling field for packaging ion beams

Pulsers for time-of-flight mass spectrometers with orthogonal ion i...

Sampler for dust on surfaces

Nonlinear resonance ejection from linear ion traps

Compact very high resolution time-of flight mass spectrometer

Travelling field for packaging ion beams

Ion trap mass spectrometer of high mass-constancy

Ion mobility spectrometer with switchable electrodes

Ion mobility spectrometer in a centripetal arrangement

Sampling device comprising a revolvable sampling wheel with a metal...

Inlet valve for a high-vacuum analyzer with bypass evacuation

Method and device for in-phase measuring of ions from ion trap mass...

Method and apparatus for generating ions from thermally unstable, n...

Method for mass-spectroscopic examination of a gas mixture and mass...

Method and instrument for mass analyzing samples with a quistor

Method of mass analyzing a sample by use of a quistor

Mass spectrometer

Ionization chamber for chemical ionization

Method for producing a mass filter analyzer system and analyzer sys...

Patents Applicationslast 30 patents

Ion-optical phase volume compression

RF quadrupole systems with potential gradients

DC voltage supply to RF electrode systems

Travelling field for packaging ion beams

Compact very high resolution time-of-flight mass spectrometer

Nonlinear resonance ejection from linear ion traps

Pulsers for time-of-flight mass spectrometers with orthogonal ion i...

Time-of-flight mass spectrometers with orthogonal ion injection

Sampler for dust on surfaces

Travelling field for packaging ion beams