Seattle, WA, US
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Patent Grant
Gerrit Jan Van Den Engh
G01 - MEASURING TESTING
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Patent Grant
Becton, Dickinson and Company
Gerrit Jan van den Engh
G01 - MEASURING TESTING
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Patent Grant
Becton, Dickinson and Company
Gerrit Jan van den Engh
G01 - MEASURING TESTING
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Patent Grant
Becton, Dickinson and Company
Gerrit Jan van den Engh
G01 - MEASURING TESTING
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Patent Grant
Cytopeia, Inc.
Gerrit van den Engh
G01 - MEASURING TESTING
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Patent Grant
The Institute For Systems Biology
Gerrit J. van den Engh
G01 - MEASURING TESTING
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Patent Grant
The Institute For Systems Biology
Gerrit J. van den Engh
G01 - MEASURING TESTING
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Patent Grant
University of Washington
David A. Basiji
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
University of Washington
David A. Basiji
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
University of Washington
Gerrit J. Van den Engh
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
Gerrit J. Van den Engh
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
The Regents of the University of California
Raymond P. Mariella
G02 - OPTICS
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Patent Grant
SyStemix, Inc.
Dennis T. Sasaki
G01 - MEASURING TESTING
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Patent Application
Gerrit Jan VAN DEN ENGH
G01 - MEASURING TESTING
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Patent Application
Becton, Dickinson and Company
Gerrit Jan van den Engh
G01 - MEASURING TESTING
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Patent Application
Becton, Dickinson and Company
Gerrit Jan van den Engh
G01 - MEASURING TESTING
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Patent Application
Gerrit J. van den Engh
G01 - MEASURING TESTING
Information
Patent Application
Gerrit Jan van den Engh
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
The Institute for Systems Biology
Gerrit J. van den Engh
G01 - MEASURING TESTING
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Patent Application
Cytopeia Incorporated
Jarred E. Swalwell
G01 - MEASURING TESTING
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Patent Application
Gerrit J. van den Engh
G01 - MEASURING TESTING
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Patent Application
Charles L. Asbury
G01 - MEASURING TESTING
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Patent Application
Gerrit J. van den Engh
G01 - MEASURING TESTING
