Gershon Perelman

Person

Loveland, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for dynamically balancing rotors
- Patent number 10,145,753
- Issue date Dec 4, 2018
- Agilent Technologies, Inc.
- Gershon Perelman
- G01 - MEASURING TESTING
Information Patent Grant
Plasma cleaning for mass spectrometers
- Patent number 9,589,775
- Issue date Mar 7, 2017
- Agilent Technologies, Inc.
- Gershon Perelman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation of charged particle optics from vacuum chamber deformations
- Patent number 9,449,805
- Issue date Sep 20, 2016
- Agilent Technologies Inc.
- Gershon Perelman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum ultraviolet photon source, ionization apparatus, and related...
- Patent number 9,153,427
- Issue date Oct 6, 2015
- Agilent Technologies, Inc.
- Noah Goldberg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Radio frequency (RF) ion guide for improved performance in mass spe...
- Patent number 9,053,915
- Issue date Jun 9, 2015
- Agilent Technologies, Inc.
- Trygve Ristroph
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radio frequency (RF) ion guide for improved performance in mass spe...
- Patent number 8,859,961
- Issue date Oct 14, 2014
- Agilent Technologies, Inc.
- Gershon Perelman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auxiliary drag field electrodes
- Patent number 7,675,031
- Issue date Mar 9, 2010
- Thermo Finnigan LLC.
- Michael Konicek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput brightfield/darkfield water inspection system using...
- Patent number 7,554,655
- Issue date Jun 30, 2009
- KLA-Tencor Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Grant
High throughput darkfield/brightfield wafer inspection system using...
- Patent number 7,522,275
- Issue date Apr 21, 2009
- KLA-Tencor Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Grant
High throughput brightfield/darkfield wafer inspection system using...
- Patent number 7,379,173
- Issue date May 27, 2008
- KLA-Tencor Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Grant
High throughput darkfield/brightfield wafer inspection system using...
- Patent number 7,259,844
- Issue date Aug 21, 2007
- KLA-Tencor Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Grant
High throughput brightfield/darkfield wafer inspection system using...
- Patent number 7,164,475
- Issue date Jan 16, 2007
- KLA-Tencor Technologies Corporation
- Christopher R Fairley
- G01 - MEASURING TESTING
Information Patent Grant
Temperature compensated time-of-flight mass spectrometer
- Patent number 6,998,607
- Issue date Feb 14, 2006
- Thermo Finnigan LLC.
- Stephen C. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deployable fast-response apparatus to recover bio-contaminated mate...
- Patent number 6,928,143
- Issue date Aug 9, 2005
- John Edgar Menear
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High throughput brightfield/darkfield wafer inspection system using...
- Patent number 6,816,249
- Issue date Nov 9, 2004
- KLA-Tencor Corporation
- Christopher R Fairley
- G01 - MEASURING TESTING
Information Patent Grant
Optical fiber Bragg grating tuning device
- Patent number 6,785,443
- Issue date Aug 31, 2004
- Teraxion Inc.
- Alexis Mendez
- G02 - OPTICS
Information Patent Grant
FBG stretching mechanism with integrated thermal compensation
- Patent number 6,498,891
- Issue date Dec 24, 2002
- Phaethon Communications
- Steve Montesanto
- G02 - OPTICS
Information Patent Grant
High throughput brightfield/darkfield wafer inspection system using...
- Patent number 6,288,780
- Issue date Sep 11, 2001
- KLA-Tencor Technologies Corp.
- Christopher R Fairley
- G01 - MEASURING TESTING
Information Patent Grant
Fourier filtering mechanism for inspecting wafers
- Patent number 5,970,168
- Issue date Oct 19, 1999
- KLA-Tencor Corporation
- Steve Montesanto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR DYNAMICALLY BALANCING ROTORS
- Publication number 20160084727
- Publication date Mar 24, 2016
- Agilent Technologies, Inc.
- Gershon Perelman
- G01 - MEASURING TESTING
Information Patent Application
ISOLATION OF CHARGED PARTICLE OPTICS FROM VACUUM CHAMBER DEFORMATIONS
- Publication number 20160086786
- Publication date Mar 24, 2016
- Agilent Technologies, Inc.
- Gershon Perelman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA CLEANING FOR MASS SPECTROMETERS
- Publication number 20160035550
- Publication date Feb 4, 2016
- Agilent Technologies, Inc.
- Gershon Perelman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Vacuum Ultraviolet Photon Source, Ionization Apparatus, and Related...
- Publication number 20140167612
- Publication date Jun 19, 2014
- AGILENT TECHNOLOGIES, INC.
- Gershon Perelman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIO FREQUENCY (RF) ION GUIDE FOR IMPROVED PERFORMANCE IN MASS SPE...
- Publication number 20140084156
- Publication date Mar 27, 2014
- AGILENT TECHNOLOGIES, INC.
- Trygve RISTROPH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIO FREQUENCY (RF) ION GUIDE FOR IMPROVED PERFORMANCE IN MASS SPE...
- Publication number 20130175440
- Publication date Jul 11, 2013
- AGILENT TECHNOLOGIES, INC.
- Gershon PERELMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR INSPECTING FURNACE TUBES
- Publication number 20090120191
- Publication date May 14, 2009
- Steven Morrison
- G01 - MEASURING TESTING
Information Patent Application
High throughput brightfield/darkfield water inspection system using...
- Publication number 20080225298
- Publication date Sep 18, 2008
- KLA-Tencor Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Application
High throughput darkfield/brightfield wafer inspection system using...
- Publication number 20080007726
- Publication date Jan 10, 2008
- KLA-Tencor Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Application
High throughput darkfield/brightfield wafer inspection system using...
- Publication number 20070115461
- Publication date May 24, 2007
- KLA-Tencor Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE COMPENSATED TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20060043283
- Publication date Mar 2, 2006
- Stephen C. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High throughput brightfield/darkfield wafer inspection system using...
- Publication number 20050062962
- Publication date Mar 24, 2005
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Application
High throughput brightfield/darkfield wafer inspection system using...
- Publication number 20040252297
- Publication date Dec 16, 2004
- KLA-Tencor Technologies Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING
Information Patent Application
Deployable fast-response apparatus to recover bio-contaminated mate...
- Publication number 20040208282
- Publication date Oct 21, 2004
- John Edgar Menear
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Optical fiber bragg grating tuning device
- Publication number 20030012499
- Publication date Jan 16, 2003
- Alexis Mendez
- G02 - OPTICS
Information Patent Application
High throughput brightfield/darkfield wafer inspection system using...
- Publication number 20020118359
- Publication date Aug 29, 2002
- KLA-Tencor Technologies Corporation
- Christopher R. Fairley
- G01 - MEASURING TESTING

Gershon Perelman

Person

Patents Grantslast 30 patents

Apparatus and method for dynamically balancing rotors

Plasma cleaning for mass spectrometers

Isolation of charged particle optics from vacuum chamber deformations

Vacuum ultraviolet photon source, ionization apparatus, and related...

Radio frequency (RF) ion guide for improved performance in mass spe...

Radio frequency (RF) ion guide for improved performance in mass spe...

Auxiliary drag field electrodes

High throughput brightfield/darkfield water inspection system using...

High throughput darkfield/brightfield wafer inspection system using...

High throughput brightfield/darkfield wafer inspection system using...

High throughput darkfield/brightfield wafer inspection system using...

High throughput brightfield/darkfield wafer inspection system using...

Temperature compensated time-of-flight mass spectrometer

Deployable fast-response apparatus to recover bio-contaminated mate...

High throughput brightfield/darkfield wafer inspection system using...

Optical fiber Bragg grating tuning device

FBG stretching mechanism with integrated thermal compensation

High throughput brightfield/darkfield wafer inspection system using...

Fourier filtering mechanism for inspecting wafers

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR DYNAMICALLY BALANCING ROTORS

ISOLATION OF CHARGED PARTICLE OPTICS FROM VACUUM CHAMBER DEFORMATIONS

PLASMA CLEANING FOR MASS SPECTROMETERS

Vacuum Ultraviolet Photon Source, Ionization Apparatus, and Related...

RADIO FREQUENCY (RF) ION GUIDE FOR IMPROVED PERFORMANCE IN MASS SPE...

RADIO FREQUENCY (RF) ION GUIDE FOR IMPROVED PERFORMANCE IN MASS SPE...

METHODS AND APPARATUS FOR INSPECTING FURNACE TUBES

High throughput brightfield/darkfield water inspection system using...

High throughput darkfield/brightfield wafer inspection system using...

High throughput darkfield/brightfield wafer inspection system using...

TEMPERATURE COMPENSATED TIME-OF-FLIGHT MASS SPECTROMETER

High throughput brightfield/darkfield wafer inspection system using...

High throughput brightfield/darkfield wafer inspection system using...

Deployable fast-response apparatus to recover bio-contaminated mate...

Optical fiber bragg grating tuning device

High throughput brightfield/darkfield wafer inspection system using...