Gerui LIU

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Aberration impact systems, models, and manufacturing processes
- Patent number 12,210,291
- Issue date Jan 28, 2025
- ASML Netherlands B.V.
- Xingyue Peng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
ABERRATION IMPACT SYSTEMS, MODELS, AND MANUFACTURING PROCESSES
- Publication number 20250138433
- Publication date May 1, 2025
- ASML NETHERLANDS B.V.
- Xingyue PENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
THERMAL CONTROL SYSTEMS, MODELS, AND MANUFACTURING PROCESSES IN LIT...
- Publication number 20250028298
- Publication date Jan 23, 2025
- ASML NETHERLANDS B.V.
- Duan-Fu Stephen HSU
- G05 - CONTROLLING REGULATING
Information Patent Application
ABERRATION IMPACT SYSTEMS, MODELS, AND MANUFACTURING PROCESSES
- Publication number 20230205096
- Publication date Jun 29, 2023
- ASML NETHERLANDS B.V.
- Xingyue PENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY