Geun-su Kim

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Busan, KR

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Patents Grantslast 30 patents

Information Patent Grant
Test probe assembly and test socket
- Patent number 11,639,945
- Issue date May 2, 2023
- LEENO INDUSTRIAL INC.
- Jae-hwan Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 11,150,270
- Issue date Oct 19, 2021
- LEENO INDUSTRIAL INC.
- Geun-su Kim
- G01 - MEASURING TESTING
Information Patent Grant
Probe socket
- Patent number 10,884,047
- Issue date Jan 5, 2021
- LEENO INDUSTRIAL INC.
- Jae-hwan Jeong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST PROBE ASSEMBLY AND TEST SOCKET
- Publication number 20200241042
- Publication date Jul 30, 2020
- LEENO INDUSTRIAL INC.
- Jae-hwan Jeong
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE
- Publication number 20200141980
- Publication date May 7, 2020
- LEENO INDUSTRIAL INC.
- Geun-su Kim
- G01 - MEASURING TESTING
Information Patent Application
PROBE SOCKET
- Publication number 20180196096
- Publication date Jul 12, 2018
- Leeno Industrial Inc.
- Jae-hwan Jeong
- G01 - MEASURING TESTING