Ghil-geun Oh

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Yongin-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Leakage current measurement circuit, integrated circuit and system...
- Patent number 10,473,716
- Issue date Nov 12, 2019
- Samsung Electronics Co., Ltd.
- Ghil-Geun Oh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LEAKAGE CURRENT MEASUREMENT CIRCUIT, INTEGRATED CIRCUIT AND SYSTEM...
- Publication number 20180356462
- Publication date Dec 13, 2018
- Samsung Electronics Co., Ltd.
- Ghil-Geun OH
- G01 - MEASURING TESTING
Information Patent Application
Fuse structure integrated in semiconductor device
- Publication number 20080143472
- Publication date Jun 19, 2008
- Samsung Electronics Co., Ltd.
- Ghil-Geun Oh
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit and method of blocking access to a protected device
- Publication number 20060284651
- Publication date Dec 21, 2006
- SAMSUNG ELECTRONICS CO., LTD.
- Ghil-geun Oh
- G11 - INFORMATION STORAGE