Ghilgeun OH

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Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD FOR SEMICONDUCTOR DEVICE
- Publication number 20230333027
- Publication date Oct 19, 2023
- Samsung Electronics Co., Ltd.
- Wookjin LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING DEFECTIVE LAYER OF SEMICONDUCTOR DEVICE AND COM...
- Publication number 20220180040
- Publication date Jun 9, 2022
- Samsung Electronics Co., Ltd.
- Junghwan KIM
- G06 - COMPUTING CALCULATING COUNTING