Gholamreza Javahery

Person

Ontario, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Discharge chambers and ionization devices, methods and systems usin...
- Patent number 11,705,319
- Issue date Jul 18, 2023
- PerkinElmer Scientific Canada ULC
- Mehrnaz Sarrafzadeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple gas flow ionizer
- Patent number 11,631,578
- Issue date Apr 18, 2023
- PerkinElmer U.S. LLC
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple analyte ion source
- Patent number 11,367,603
- Issue date Jun 21, 2022
- PerkinElmer Health Sciences Canada, Inc.
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple gas flow ionizer
- Patent number 11,094,520
- Issue date Aug 17, 2021
- PerkinElmer Health Sciences Canada, Inc.
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Discharge chambers and ionization devices, methods and systems usin...
- Patent number 11,031,227
- Issue date Jun 8, 2021
- PerkinElmer Health Sciences Canada, Inc.
- Mehrnaz Sarrafzadeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Off-axis ionization devices and systems using them
- Patent number 10,658,167
- Issue date May 19, 2020
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Heather Gamble
- G01 - MEASURING TESTING
Information Patent Grant
Multiple gas flow ionizer
- Patent number 10,658,168
- Issue date May 19, 2020
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual chamber electron impact and chemical ionization source
- Patent number 10,636,645
- Issue date Apr 28, 2020
- PerkinElmer Health Sciences Canada, Inc.
- Heather Gamble
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization sources and systems and methods using them
- Patent number 10,622,200
- Issue date Apr 14, 2020
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Anna Kornilova
- G01 - MEASURING TESTING
Information Patent Grant
Mass analyser interface
- Patent number 9,916,969
- Issue date Mar 13, 2018
- PerkinElmer Health Sciences Canada, Inc.
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer interface
- Patent number 9,449,803
- Issue date Sep 20, 2016
- PerkinElmer Health Sciences Canada, Inc.
- Charles Jolliffe
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Multi-pressure stage mass spectrometer and methods
- Patent number 9,343,280
- Issue date May 17, 2016
- PerkinElmer Health Sciences Canada, Inc.
- Lisa Cousins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-contact trace chemical screening
- Patent number 9,048,076
- Issue date Jun 2, 2015
- MSDetection Corp.
- William R. Stott
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer interface
- Patent number 8,946,622
- Issue date Feb 3, 2015
- Ionics Mass Spectrometry Group, Inc.
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer interface
- Patent number 8,546,750
- Issue date Oct 1, 2013
- Ionics Mass Spectrometry Group, Inc.
- Charles Jolliffe
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
High pressure collision cell for mass spectrometer
- Patent number 8,080,785
- Issue date Dec 20, 2011
- Ionic Mass Spectrometry Group
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source vessel and methods
- Patent number 8,044,348
- Issue date Oct 25, 2011
- Ionics Mass Spectrometry Group Inc.
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High sensitivity mass spectrometer interface for multiple ion sources
- Patent number 8,008,619
- Issue date Aug 30, 2011
- Ionics Mass Spectrometry Group
- Charles Jolliffe
- G01 - MEASURING TESTING
Information Patent Grant
Concentrating mass spectrometer ion guide, spectrometer and method
- Patent number 7,932,488
- Issue date Apr 26, 2011
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer ion guide providing axial field, and method
- Patent number 7,868,289
- Issue date Jan 11, 2011
- Ionics Mass Spectrometry Group Inc.
- Lisa Cousins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting positively charged and negativel...
- Patent number 7,728,292
- Issue date Jun 1, 2010
- Ionics Mass Spectrometry Group Inc.
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High sensitivity mass spectrometer interface for multiple ion sources
- Patent number 7,687,771
- Issue date Mar 30, 2010
- Ionics Mass Spectrometry Group
- Charles Jolliffe
- G01 - MEASURING TESTING
Information Patent Grant
Ion source vessel and methods
- Patent number 7,659,505
- Issue date Feb 9, 2010
- Ionics Mass Spectrometry Group Inc.
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Concentrating mass spectrometer ion guide, spectrometer and method
- Patent number 7,569,811
- Issue date Aug 4, 2009
- Ionics Mass Spectrometry Group Inc.
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for separation of isobaric interferences
- Patent number 7,439,498
- Issue date Oct 21, 2008
- Albert Edward Litherland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer interface
- Patent number 7,405,398
- Issue date Jul 29, 2008
- IONICS Mass Spectrometry Group, Inc.
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer interface
- Patent number 7,091,477
- Issue date Aug 15, 2006
- Ionica Mass Spectrometry Group, Inc.
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for tandem ICP/FAIMS/MS
- Patent number 6,799,355
- Issue date Oct 5, 2004
- National Research Council Canada
- Roger Guevremont
- G01 - MEASURING TESTING
Information Patent Grant
High pressure MS/MS system
- Patent number 6,093,929
- Issue date Jul 25, 2000
- MDS Inc.
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE GAS FLOW IONIZER
- Publication number 20220223399
- Publication date Jul 14, 2022
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISCHARGE CHAMBERS AND IONIZATION DEVICES, METHODS AND SYSTEMS USIN...
- Publication number 20220102130
- Publication date Mar 31, 2022
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Mehrnaz Sarrafzadeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE GAS FLOW IONIZER
- Publication number 20200395205
- Publication date Dec 17, 2020
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE ANALYTE ION SOURCE
- Publication number 20200350150
- Publication date Nov 5, 2020
- PERKINELMER HEALTH SCIENCES CANADA INC
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION SOURCES AND SYSTEMS AND METHODS USING THEM
- Publication number 20190355566
- Publication date Nov 21, 2019
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Anna Kornilova
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISCHARGE CHAMBERS AND IONIZATION DEVICES, METHODS AND SYSTEMS USIN...
- Publication number 20190355565
- Publication date Nov 21, 2019
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Mehrnaz Sarrafzadeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE GAS FLOW IONIZER
- Publication number 20190341241
- Publication date Nov 7, 2019
- Frenny Kaushal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OFF-AXIS IONIZATION DEVICES AND SYSTEMS USING THEM
- Publication number 20190189417
- Publication date Jun 20, 2019
- Heather Gamble
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT TRACE CHEMICAL SCREENING
- Publication number 20150311053
- Publication date Oct 29, 2015
- MSDETECTION CORP.
- WILLIAM R. STOTT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer Interface
- Publication number 20150214021
- Publication date Jul 30, 2015
- Ionics Mass Spectrometry Group Inc.
- Charles JOLLIFFE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSER INTERFACE
- Publication number 20140197333
- Publication date Jul 17, 2014
- Ionics Mass Spectrometry Group Inc.
- Charles JOLLIFFE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT TRACE CHEMICAL SCREENING
- Publication number 20140117223
- Publication date May 1, 2014
- MSDETECTION CORP.
- William R. Stott
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER INTERFACE
- Publication number 20140087478
- Publication date Mar 27, 2014
- Ionics Mass Spectrometry Group Inc.
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER ION GUIDE PROVIDING AXIAL FIELD, AND METHOD
- Publication number 20110133079
- Publication date Jun 9, 2011
- Lisa Cousins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETECTING POSITIVELY CHARGED AND NEGATIVEL...
- Publication number 20100252729
- Publication date Oct 7, 2010
- Ionics Mass Spectrometry Group Inc.
- Charles JOLLIFFE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE VESSEL AND METHODS
- Publication number 20100171033
- Publication date Jul 8, 2010
- Ionics Mass Spectrometry Group Inc.
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High sensitivity mass spectrometer interface for multiple ion sources
- Publication number 20100148059
- Publication date Jun 17, 2010
- IONICS MASS SPECTROMETRY GROUP
- Charles Jolliffe
- G01 - MEASURING TESTING
Information Patent Application
CONCENTRATING MASS SPECTROMETER ION GUIDE, SPECTROMETER AND METHOD
- Publication number 20090218484
- Publication date Sep 3, 2009
- Ionics Mass Spectrometry Group Inc.
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE VESSEL AND METHODS
- Publication number 20090194687
- Publication date Aug 6, 2009
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High pressure collision cell for mass spectrometer
- Publication number 20090065692
- Publication date Mar 12, 2009
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER ION GUIDE PROVIDING AXIAL FIELD, AND METHOD
- Publication number 20080265154
- Publication date Oct 30, 2008
- Ionics Mass Spectrometry Inc.
- Lisa Cousins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER INTERFACE
- Publication number 20080258052
- Publication date Oct 23, 2008
- Ionics Mass Spectrometry Group, Inc.
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETECTING POSITIVELY CHARGED AND NEGATIVEL...
- Publication number 20080073530
- Publication date Mar 27, 2008
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High sensitivity mass spectrometer interface for multiple ion sources
- Publication number 20070181800
- Publication date Aug 9, 2007
- Charles Jolliffe
- G01 - MEASURING TESTING
Information Patent Application
Concentrating mass spectrometer ion guide, spectrometer and method
- Publication number 20070164213
- Publication date Jul 19, 2007
- Ionics Mass Spectrometry Group Inc.
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer interface
- Publication number 20060186334
- Publication date Aug 24, 2006
- IONICS Mass Spectometry Group, Inc.
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for separation of isobaric interferences
- Publication number 20060113464
- Publication date Jun 1, 2006
- Albert Edward Litherland
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Mass spectrometer interface
- Publication number 20050035287
- Publication date Feb 17, 2005
- Charles Jolliffe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for tandem icp/faims/ms
- Publication number 20030213904
- Publication date Nov 20, 2003
- Roger Guevremont
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for tandem icp/faims/ms
- Publication number 20030089849
- Publication date May 15, 2003
- Roger Guevremont
- G01 - MEASURING TESTING

Gholamreza Javahery

Person

Patents Grantslast 30 patents

Discharge chambers and ionization devices, methods and systems usin...

Multiple gas flow ionizer

Multiple analyte ion source

Multiple gas flow ionizer

Discharge chambers and ionization devices, methods and systems usin...

Off-axis ionization devices and systems using them

Multiple gas flow ionizer

Dual chamber electron impact and chemical ionization source

Ionization sources and systems and methods using them

Mass analyser interface

Mass spectrometer interface

Multi-pressure stage mass spectrometer and methods

Non-contact trace chemical screening

Mass spectrometer interface

Mass spectrometer interface

High pressure collision cell for mass spectrometer

Ion source vessel and methods

High sensitivity mass spectrometer interface for multiple ion sources

Concentrating mass spectrometer ion guide, spectrometer and method

Mass spectrometer ion guide providing axial field, and method

Method and apparatus for detecting positively charged and negativel...

High sensitivity mass spectrometer interface for multiple ion sources

Ion source vessel and methods

Concentrating mass spectrometer ion guide, spectrometer and method

Method and apparatus for separation of isobaric interferences

Mass spectrometer interface

Mass spectrometer interface

Apparatus and method for tandem ICP/FAIMS/MS

High pressure MS/MS system

Patents Applicationslast 30 patents

MULTIPLE GAS FLOW IONIZER

DISCHARGE CHAMBERS AND IONIZATION DEVICES, METHODS AND SYSTEMS USIN...

MULTIPLE GAS FLOW IONIZER

MULTIPLE ANALYTE ION SOURCE

IONIZATION SOURCES AND SYSTEMS AND METHODS USING THEM

DISCHARGE CHAMBERS AND IONIZATION DEVICES, METHODS AND SYSTEMS USIN...

MULTIPLE GAS FLOW IONIZER

OFF-AXIS IONIZATION DEVICES AND SYSTEMS USING THEM

NON-CONTACT TRACE CHEMICAL SCREENING

Mass Spectrometer Interface

MASS ANALYSER INTERFACE

NON-CONTACT TRACE CHEMICAL SCREENING

MASS SPECTROMETER INTERFACE

MASS SPECTROMETER ION GUIDE PROVIDING AXIAL FIELD, AND METHOD

METHOD AND APPARATUS FOR DETECTING POSITIVELY CHARGED AND NEGATIVEL...

ION SOURCE VESSEL AND METHODS

High sensitivity mass spectrometer interface for multiple ion sources

CONCENTRATING MASS SPECTROMETER ION GUIDE, SPECTROMETER AND METHOD

ION SOURCE VESSEL AND METHODS

High pressure collision cell for mass spectrometer

MASS SPECTROMETER ION GUIDE PROVIDING AXIAL FIELD, AND METHOD

MASS SPECTROMETER INTERFACE

METHOD AND APPARATUS FOR DETECTING POSITIVELY CHARGED AND NEGATIVEL...

High sensitivity mass spectrometer interface for multiple ion sources

Concentrating mass spectrometer ion guide, spectrometer and method

Mass spectrometer interface

Method and apparatus for separation of isobaric interferences

Mass spectrometer interface

Apparatus and method for tandem icp/faims/ms

Apparatus and method for tandem icp/faims/ms