Gi-Won Cha

Person

Kyungki, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Voltage boosting circuit having cross-coupled precharge circuits
- Patent number 6,225,854
- Issue date May 1, 2001
- Samsung Electronics Co., Ltd.
- Gi-Won Cha
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with a multi-bank structure
- Patent number 6,172,931
- Issue date Jan 9, 2001
- Samsung Electronics Co., Ltd.
- Gi-Won Cha
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit memory device
- Patent number 6,118,722
- Issue date Sep 12, 2000
- Samsung Electronics, Co., Ltd.
- Jun-young Jeon
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with cascaded burn-in test capability
- Patent number 6,018,485
- Issue date Jan 25, 2000
- Samsung Electronics Co., Ltd.
- Gi-Won Cha
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory sub-word line driver operated by unboosted voltage
- Patent number 5,940,343
- Issue date Aug 17, 1999
- Samsung Electronics, Co., Ltd.
- Gi-won Cha
- G11 - INFORMATION STORAGE
Information Patent Grant
Burn-in stress control circuit for a semiconductor memory device
- Patent number 5,881,004
- Issue date Mar 9, 1999
- Samsung Electronics, Co., Ltd.
- Gi-won Cha
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit memory devices including split word lines and pr...
- Patent number 5,812,483
- Issue date Sep 22, 1998
- Samsung Electronics Co., Ltd.
- Jun-Young Jeon
- G11 - INFORMATION STORAGE
Information Patent Grant
Burn-in test circuit and method in semiconductor memory device
- Patent number 5,638,331
- Issue date Jun 10, 1997
- Samsung Electronics Co., Ltd.
- Gi-Woon Cha
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for controlling a self-refresh period in a semiconductor me...
- Patent number 5,495,452
- Issue date Feb 27, 1996
- Samsung Electronics Co., Ltd.
- Gi-Won Cha
- G11 - INFORMATION STORAGE

Person

Patents Grantslast 30 patents

Voltage boosting circuit having cross-coupled precharge circuits

Semiconductor memory device with a multi-bank structure

Integrated circuit memory device

Semiconductor memory device with cascaded burn-in test capability

Memory sub-word line driver operated by unboosted voltage

Burn-in stress control circuit for a semiconductor memory device

Integrated circuit memory devices including split word lines and pr...

Burn-in test circuit and method in semiconductor memory device

Circuit for controlling a self-refresh period in a semiconductor me...