Gian F. Lorusso

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Leefdaal, BE

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Patents Grantslast 30 patents

Information Patent Grant
Automated feature analysis with off-axis tilting
- Patent number 7,423,269
- Issue date Sep 9, 2008
- KLA-Tencor Technologies Corporation
- Amir Azordegan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for aberration-insensitive electron beam imaging
- Patent number 7,405,402
- Issue date Jul 29, 2008
- KLA-Tencor Technologies Corporation
- Srinivas Vedula
- G01 - MEASURING TESTING
Information Patent Grant
Calibration standards and methods
- Patent number 7,361,941
- Issue date Apr 22, 2008
- KLA-Tencor Technologies Corporation
- Gian F. Lorusso
- G01 - MEASURING TESTING