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Gian F. Lorusso
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Leefdaal, BE
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last 30 patents
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Patent Grant
Automated feature analysis with off-axis tilting
Patent number
7,423,269
Issue date
Sep 9, 2008
KLA-Tencor Technologies Corporation
Amir Azordegan
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Method and apparatus for aberration-insensitive electron beam imaging
Patent number
7,405,402
Issue date
Jul 29, 2008
KLA-Tencor Technologies Corporation
Srinivas Vedula
G01 - MEASURING TESTING
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Patent Grant
Calibration standards and methods
Patent number
7,361,941
Issue date
Apr 22, 2008
KLA-Tencor Technologies Corporation
Gian F. Lorusso
G01 - MEASURING TESTING