Gianni S. Alsasua

Person

Rancho Cordova, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Executing a refresh operation in a memory sub-system
- Patent number 12,009,042
- Issue date Jun 11, 2024
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Word line group read counters
- Patent number 11,934,689
- Issue date Mar 19, 2024
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature informed memory refresh
- Patent number 11,887,651
- Issue date Jan 30, 2024
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read count scaling factor for data integrity scan
- Patent number 11,782,627
- Issue date Oct 10, 2023
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adjusting scan event thresholds to mitigate memory errors
- Patent number 11,709,633
- Issue date Jul 25, 2023
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
SLC page read
- Patent number 11,688,473
- Issue date Jun 27, 2023
- Micron Technology, Inc.
- Harish Reddy Singidi
- G11 - INFORMATION STORAGE
Information Patent Grant
Selective wordline scans based on a data state metric
- Patent number 11,682,446
- Issue date Jun 20, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Temperature correction in memory sub-systems
- Patent number 11,544,008
- Issue date Jan 3, 2023
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adjusting a reliability scan threshold in a memory sub-system
- Patent number 11,521,699
- Issue date Dec 6, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Word line group read counters
- Patent number 11,507,300
- Issue date Nov 22, 2022
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Block read count voltage adjustment
- Patent number 11,456,037
- Issue date Sep 27, 2022
- Micron Technology, Inc.
- Harish Singidi
- G11 - INFORMATION STORAGE
Information Patent Grant
Temperature informed memory refresh
- Patent number 11,335,394
- Issue date May 17, 2022
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storing page write attributes
- Patent number 11,301,146
- Issue date Apr 12, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read count scaling factor for data integrity scan
- Patent number 11,287,998
- Issue date Mar 29, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selective wordline scans based on a data state metric
- Patent number 11,282,564
- Issue date Mar 22, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Adjusting scan event thresholds to mitigate memory errors
- Patent number 11,269,553
- Issue date Mar 8, 2022
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read disturb scan consolidation
- Patent number 11,200,957
- Issue date Dec 14, 2021
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic error handling in a memory system
- Patent number 11,126,495
- Issue date Sep 21, 2021
- Micron Technology, Inc.
- Renato Padilla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimized scan interval
- Patent number 11,056,156
- Issue date Jul 6, 2021
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Grant
Block read count voltage adjustment
- Patent number 11,031,089
- Issue date Jun 8, 2021
- Micron Technology, Inc.
- Harish Reddy Singidi
- G11 - INFORMATION STORAGE
Information Patent Grant
Temperature correction in memory sub-systems
- Patent number 11,023,177
- Issue date Jun 1, 2021
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature informed memory refresh
- Patent number 10,998,034
- Issue date May 4, 2021
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read disturb scan consolidation
- Patent number 10,950,317
- Issue date Mar 16, 2021
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature informed memory refresh
- Patent number 10,796,745
- Issue date Oct 6, 2020
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Block read count voltage adjustment
- Patent number 10,755,792
- Issue date Aug 25, 2020
- Micron Technology, Inc.
- Harish Reddy Singidi
- G11 - INFORMATION STORAGE
Information Patent Grant
SLC page read
- Patent number 10,755,793
- Issue date Aug 25, 2020
- Micron Technology, Inc.
- Harish Singidi
- G11 - INFORMATION STORAGE
Information Patent Grant
Temperature correction in memory sub-systems
- Patent number 10,719,271
- Issue date Jul 21, 2020
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adjusting scan event thresholds to mitigate memory errors
- Patent number 10,691,377
- Issue date Jun 23, 2020
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature informed memory refresh
- Patent number 10,672,452
- Issue date Jun 2, 2020
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storing page write attributes
- Patent number 10,671,298
- Issue date Jun 2, 2020
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WORD LINE GROUP READ COUNTERS
- Publication number 20230076362
- Publication date Mar 9, 2023
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXECUTING A REFRESH OPERATION IN A MEMORY SUB-SYSTEM
- Publication number 20230059923
- Publication date Feb 23, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE INFORMED MEMORY REFRESH
- Publication number 20220277787
- Publication date Sep 1, 2022
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADJUSTING SCAN EVENT THRESHOLDS TO MITIGATE MEMORY ERRORS
- Publication number 20220188040
- Publication date Jun 16, 2022
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTIVE WORDLINE SCANS BASED ON A DATA STATE METRIC
- Publication number 20220180922
- Publication date Jun 9, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
READ COUNT SCALING FACTOR FOR DATA INTEGRITY SCAN
- Publication number 20220179577
- Publication date Jun 9, 2022
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADJUSTING A RELIABILITY SCAN THRESHOLD IN A MEMORY SUB-SYSTEM
- Publication number 20220139481
- Publication date May 5, 2022
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WORD LINE GROUP READ COUNTERS
- Publication number 20220129187
- Publication date Apr 28, 2022
- Micron Technology, Inc.
- Michael G. Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BLOCK READ COUNT VOLTAGE ADJUSTMENT
- Publication number 20210264991
- Publication date Aug 26, 2021
- Micron Technology, Inc.
- Harish Singidi
- G11 - INFORMATION STORAGE
Information Patent Application
TEMPERATURE INFORMED MEMORY REFRESH
- Publication number 20210241823
- Publication date Aug 5, 2021
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE CORRECTION IN MEMORY SUB-SYSTEMS
- Publication number 20210232342
- Publication date Jul 29, 2021
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
READ DISTURB SCAN CONSOLIDATION
- Publication number 20210191815
- Publication date Jun 24, 2021
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
READ COUNT SCALING FACTOR FOR DATA INTEGRITY SCAN
- Publication number 20210034274
- Publication date Feb 4, 2021
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
READ DISTURB SCAN CONSOLIDATION
- Publication number 20210035649
- Publication date Feb 4, 2021
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE INFORMED MEMORY REFRESH
- Publication number 20200411083
- Publication date Dec 31, 2020
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SLC PAGE READ
- Publication number 20200365219
- Publication date Nov 19, 2020
- Micron Technology, Inc.
- Harish Reddy Singidi
- G11 - INFORMATION STORAGE
Information Patent Application
BLOCK READ COUNT VOLTAGE ADJUSTMENT
- Publication number 20200335172
- Publication date Oct 22, 2020
- Micron Technology, Inc.
- Harish Reddy Singidi
- G11 - INFORMATION STORAGE
Information Patent Application
TEMPERATURE CORRECTION IN MEMORY SUB-SYSTEMS
- Publication number 20200319827
- Publication date Oct 8, 2020
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORING PAGE WRITE ATTRIBUTES
- Publication number 20200293203
- Publication date Sep 17, 2020
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADJUSTING SCAN EVENT THRESHOLDS TO MITIGATE MEMORY ERRORS
- Publication number 20200278814
- Publication date Sep 3, 2020
- Micron Technology,Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE INFORMED MEMORY REFRESH
- Publication number 20200251162
- Publication date Aug 6, 2020
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE CORRECTION IN MEMORY SUB-SYSTEMS
- Publication number 20200159446
- Publication date May 21, 2020
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZED SCAN INTERVAL
- Publication number 20200160894
- Publication date May 21, 2020
- Micron Technology, Inc.
- Kishore Kumar Muchherla
- G11 - INFORMATION STORAGE
Information Patent Application
TEMPERATURE INFORMED MEMORY REFRESH
- Publication number 20200098421
- Publication date Mar 26, 2020
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADJUSTED SCAN EVENT THRESHOLDS
- Publication number 20200097211
- Publication date Mar 26, 2020
- Micron Technology, Inc.
- Gianni Stephen Alsasua
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BLOCK READ COUNT VOLTAGE ADJUSTMENT
- Publication number 20200020407
- Publication date Jan 16, 2020
- Micron Technology, Inc.
- Harish Reddy Singidi
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC ERROR HANDLING IN A MEMORY SYSTEM
- Publication number 20190278653
- Publication date Sep 12, 2019
- Renato Padilla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORING PAGE WRITE ATTRIBUTES
- Publication number 20190278491
- Publication date Sep 12, 2019
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SLC PAGE READ
- Publication number 20190130983
- Publication date May 2, 2019
- Micron Technology, Inc.
- Harish Singidi
- G11 - INFORMATION STORAGE
Information Patent Application
Block Read Count Voltage Adjustment
- Publication number 20190130980
- Publication date May 2, 2019
- Harish Singidi
- G11 - INFORMATION STORAGE

Gianni S. Alsasua

Person

Patents Grantslast 30 patents

Executing a refresh operation in a memory sub-system

Word line group read counters

Temperature informed memory refresh

Read count scaling factor for data integrity scan

Adjusting scan event thresholds to mitigate memory errors

SLC page read

Selective wordline scans based on a data state metric

Temperature correction in memory sub-systems

Adjusting a reliability scan threshold in a memory sub-system

Word line group read counters

Block read count voltage adjustment

Temperature informed memory refresh

Storing page write attributes

Read count scaling factor for data integrity scan

Selective wordline scans based on a data state metric

Adjusting scan event thresholds to mitigate memory errors

Read disturb scan consolidation

Dynamic error handling in a memory system

Optimized scan interval

Block read count voltage adjustment

Temperature correction in memory sub-systems

Temperature informed memory refresh

Read disturb scan consolidation

Temperature informed memory refresh

Block read count voltage adjustment

SLC page read

Temperature correction in memory sub-systems

Adjusting scan event thresholds to mitigate memory errors

Temperature informed memory refresh

Storing page write attributes

Patents Applicationslast 30 patents

WORD LINE GROUP READ COUNTERS

EXECUTING A REFRESH OPERATION IN A MEMORY SUB-SYSTEM

TEMPERATURE INFORMED MEMORY REFRESH

ADJUSTING SCAN EVENT THRESHOLDS TO MITIGATE MEMORY ERRORS

SELECTIVE WORDLINE SCANS BASED ON A DATA STATE METRIC

READ COUNT SCALING FACTOR FOR DATA INTEGRITY SCAN

ADJUSTING A RELIABILITY SCAN THRESHOLD IN A MEMORY SUB-SYSTEM

WORD LINE GROUP READ COUNTERS

BLOCK READ COUNT VOLTAGE ADJUSTMENT

TEMPERATURE INFORMED MEMORY REFRESH

TEMPERATURE CORRECTION IN MEMORY SUB-SYSTEMS

READ DISTURB SCAN CONSOLIDATION

READ COUNT SCALING FACTOR FOR DATA INTEGRITY SCAN

READ DISTURB SCAN CONSOLIDATION

TEMPERATURE INFORMED MEMORY REFRESH

SLC PAGE READ

BLOCK READ COUNT VOLTAGE ADJUSTMENT

TEMPERATURE CORRECTION IN MEMORY SUB-SYSTEMS

STORING PAGE WRITE ATTRIBUTES

ADJUSTING SCAN EVENT THRESHOLDS TO MITIGATE MEMORY ERRORS

TEMPERATURE INFORMED MEMORY REFRESH

TEMPERATURE CORRECTION IN MEMORY SUB-SYSTEMS

OPTIMIZED SCAN INTERVAL

TEMPERATURE INFORMED MEMORY REFRESH

ADJUSTED SCAN EVENT THRESHOLDS

BLOCK READ COUNT VOLTAGE ADJUSTMENT

DYNAMIC ERROR HANDLING IN A MEMORY SYSTEM

STORING PAGE WRITE ATTRIBUTES

SLC PAGE READ

Block Read Count Voltage Adjustment