Giesbert Hoelzer

Follow

Person

Erfurt, DE

People

Patents Applicationslast 30 patents

Information Patent Application
Electrical Measurement Of The Thickness Of A Semiconductor Layer
- Publication number 20080100311
- Publication date May 1, 2008
- X-FAB SEMICONDUCTOR FOUNDRIES AG.
- Karlheinz Freywald
- G01 - MEASURING TESTING