Gijs van Duinen

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Utrecht, NL

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Patents Grantslast 30 patents

Information Patent Grant
Cryogenic cell for mounting a specimen in a charged particle micros...
- Patent number 10,651,007
- Issue date May 12, 2020
- FEI Company
- Gerbert Jeroen Van De Water
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aligning a featureless thin film in a TEM
- Patent number 9,583,303
- Issue date Feb 28, 2017
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of investigating the wavefront of a charged-particle beam
- Patent number 9,202,670
- Issue date Dec 1, 2015
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of investigating and correcting aberrations in a charged-par...
- Patent number 9,136,087
- Issue date Sep 15, 2015
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CRYOGENIC CELL FOR MOUNTING A SPECIMEN IN A CHARGED PARTICLE MICROS...
- Publication number 20190131105
- Publication date May 2, 2019
- FEI Company
- Gerbert Jeroen VAN DE WATER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNING A FEATURELESS THIN FILM IN A TEM
- Publication number 20160104596
- Publication date Apr 14, 2016
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INVESTIGATING THE WAVEFRONT OF A CHARGED-PARTICLE BEAM
- Publication number 20150170876
- Publication date Jun 18, 2015
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Investigating and Correcting Aberrations in a Charged-Par...
- Publication number 20140061464
- Publication date Mar 6, 2014
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS