Gil Balog

Person

Jerusalem, IL

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for binning at final test
- Patent number 10,118,200
- Issue date Nov 6, 2018
- Optimal Plus Ltd.
- Reed Linde
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Systems and methods for test time outlier detection and correction...
- Patent number 9,529,036
- Issue date Dec 27, 2016
- Optimal Plus Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for test time outlier detection and correction...
- Patent number 8,872,538
- Issue date Oct 28, 2014
- Optimal Plus Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for parametric testing
- Patent number 8,781,773
- Issue date Jul 15, 2014
- Optimal Plus Ltd
- Leonid Gurov
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for test time outlier detection and correction...
- Patent number 8,421,494
- Issue date Apr 16, 2013
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
System and methods for parametric test time reduction
- Patent number 8,112,249
- Issue date Feb 7, 2012
- Optimaltest Ltd
- Leonid Gurov
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor testing using a testing scena...
- Patent number 8,069,130
- Issue date Nov 29, 2011
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for test time outlier detection and correction...
- Patent number 7,969,174
- Issue date Jun 28, 2011
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor testing using reference dice
- Patent number 7,777,515
- Issue date Aug 17, 2010
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor testing using reference dice
- Patent number 7,737,716
- Issue date Jun 15, 2010
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor testing using reference dice
- Patent number 7,679,392
- Issue date Mar 16, 2010
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor testing using a testing scena...
- Patent number 7,567,947
- Issue date Jul 28, 2009
- Optimaltest Ltd
- Gil Balog
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for semiconductor testing using reference dice
- Patent number 7,532,024
- Issue date May 12, 2009
- Optimaltest Ltd
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Methods for slow test time detection of an integrated circuit durin...
- Patent number 7,528,622
- Issue date May 5, 2009
- Optimal Test Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Grant
Augmenting semiconductor's devices quality and reliability
- Patent number 7,340,359
- Issue date Mar 4, 2008
- Optimaltest Ltd
- Nir Erez
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...
- Publication number 20150012237
- Publication date Jan 8, 2015
- Optimal Plus Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...
- Publication number 20130193994
- Publication date Aug 1, 2013
- OptimalTest, Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENA...
- Publication number 20120109874
- Publication date May 3, 2012
- OptimalTest Ltd.
- Gil Balog
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHODS FOR PARAMETRIC TESTING
- Publication number 20110251812
- Publication date Oct 13, 2011
- OptimalTest Ltd.
- Leonid GUROV
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...
- Publication number 20110224938
- Publication date Sep 15, 2011
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
System and Methods for Parametric Test Time Reduction
- Publication number 20100161276
- Publication date Jun 24, 2010
- OptimalTest Ltd.
- Leonid Gurov
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENA...
- Publication number 20090265300
- Publication date Oct 22, 2009
- OptimalTest Ltd.
- Gil Balog
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...
- Publication number 20090192754
- Publication date Jul 30, 2009
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING REFERENCE DICE
- Publication number 20090115445
- Publication date May 7, 2009
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING REFERENCE DICE
- Publication number 20090119048
- Publication date May 7, 2009
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING REFERENCE DICE
- Publication number 20090112501
- Publication date Apr 30, 2009
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
DATALOG MANAGEMENT IN SEMICONDUCTOR TESTING
- Publication number 20090013218
- Publication date Jan 8, 2009
- Optimal Test Ltd.
- Eran ROUSSEAU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Augmenting semiconductor's devices quality and reliability
- Publication number 20080114558
- Publication date May 15, 2008
- OPTIMAL TEST LTD.
- Nir Erez
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for semiconductor testing using reference dice
- Publication number 20080007284
- Publication date Jan 10, 2008
- OptimalTest Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for semiconductor testing using a testing scena...
- Publication number 20070233629
- Publication date Oct 4, 2007
- Gil Balog
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and methods for test time outlier detection and correction i...
- Publication number 20070132477
- Publication date Jun 14, 2007
- Optimal Test Ltd.
- Gil Balog
- G01 - MEASURING TESTING
Information Patent Application
Augmenting semiconductor's devices quality and reliability
- Publication number 20060267577
- Publication date Nov 30, 2006
- Nir Erez
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

System and method for binning at final test

Systems and methods for test time outlier detection and correction...

Systems and methods for test time outlier detection and correction...

System and methods for parametric testing

Systems and methods for test time outlier detection and correction...

System and methods for parametric test time reduction

Methods and systems for semiconductor testing using a testing scena...

Systems and methods for test time outlier detection and correction...

Methods and systems for semiconductor testing using reference dice

Methods and systems for semiconductor testing using reference dice

Methods and systems for semiconductor testing using reference dice

Methods and systems for semiconductor testing using a testing scena...

Methods and systems for semiconductor testing using reference dice

Methods for slow test time detection of an integrated circuit durin...

Augmenting semiconductor's devices quality and reliability

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...

SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...

METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENA...

SYSTEM AND METHODS FOR PARAMETRIC TESTING

SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...

System and Methods for Parametric Test Time Reduction

METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENA...

SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION...

METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING REFERENCE DICE

METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING REFERENCE DICE

METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING REFERENCE DICE

DATALOG MANAGEMENT IN SEMICONDUCTOR TESTING

Augmenting semiconductor's devices quality and reliability

Methods and systems for semiconductor testing using reference dice

Methods and systems for semiconductor testing using a testing scena...

System and methods for test time outlier detection and correction i...

Augmenting semiconductor's devices quality and reliability