Gil Ho GU

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Substrate analysis apparatus and substrate analysis method
- Patent number 11,982,705
- Issue date May 14, 2024
- Samsung Electronics Co., Ltd.
- Youn Gon Oh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR MANUFACTURING ANALYTICAL SEMICONDUCTOR SAMPLES AND ME...
- Publication number 20240085282
- Publication date Mar 14, 2024
- Samsung Electronics Co., Ltd.
- Min Chul JO
- B24 - GRINDING POLISHING
Information Patent Application
EQUIPMENT FRONT END MODULE AND DESTRUCTIVE ANALYSIS AUTOMATION APPA...
- Publication number 20230107043
- Publication date Apr 6, 2023
- Samsung Electronics Co., Ltd.
- Youn Gon OH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRAY AND DESTRUCTIVE ANALYSIS AUTOMATION APPARATUS INCLUDING THE SAME
- Publication number 20230101674
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Youn Gon OH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE ANALYSIS APPARATUS AND SUBSTRATE ANALYSIS METHOD
- Publication number 20230067060
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Youn Gon OH
- G01 - MEASURING TESTING