GIL LOEWENTHAL

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TEL-AVIV, IL

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Patents Grantslast 30 patents

Information Patent Grant
Layer detection for high aspect ratio etch control
- Patent number 11,929,291
- Issue date Mar 12, 2024
- Nova Ltd.
- Gil Loewenthal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layer detection for high aspect ratio etch control
- Patent number 11,107,738
- Issue date Aug 31, 2021
- Nova Ltd.
- Gil Loewenthal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LAYER DETECTION FOR HIGH ASPECT RATIO ETCH CONTROL
- Publication number 20220044975
- Publication date Feb 10, 2022
- NOVA LTD
- Gil Loewenthal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYER DETECTION FOR HIGH ASPECT RATIO ETCH CONTROL
- Publication number 20200194320
- Publication date Jun 18, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- GIL LOEWENTHAL
- G01 - MEASURING TESTING