Gil Weisman

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Kfar Tavor, IL

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit sample preparation for alpha emission measurements
- Patent number 8,471,215
- Issue date Jun 25, 2013
- Marvell Israel (M.I.S.L) Ltd.
- Eli Kurin
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit sample preparation for alpha emission measurements
- Patent number 8,330,117
- Issue date Dec 11, 2012
- Marvell Israel (M.I.S.L) Ltd.
- Eli Kurin
- G01 - MEASURING TESTING