Gil-Woo SONG

Person

Hwaseong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting surface and method of manufacturing semiconduc...
- Patent number 11,043,433
- Issue date Jun 22, 2021
- Samsung Electronics Co., Ltd.
- Sung-yoon Ryu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring semiconductor device
- Patent number 10,551,326
- Issue date Feb 4, 2020
- Samsung Electronics Co., Ltd.
- Hyo Hyeong Kang
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting surface and method of manufacturing semiconduc...
- Patent number 10,249,544
- Issue date Apr 2, 2019
- Samsung Electronics Co., Ltd.
- Sung-yoon Ryu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface inspecting method
- Patent number 10,001,444
- Issue date Jun 19, 2018
- Samsung Electronics Co., Ltd.
- Kang-woong Ko
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting overlay error and method for manufacturing sem...
- Patent number 9,841,688
- Issue date Dec 12, 2017
- Samsung Electronics Co., Ltd.
- Kang-Woong Ko
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Ellipsometer for detecting surface
- Patent number 9,267,879
- Issue date Feb 23, 2016
- Samsung Electronics Co., Ltd.
- Kang-woong Ko
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF INSPECTING SURFACE AND METHOD OF MANUFACTURING SEMICONDUC...
- Publication number 20190214316
- Publication date Jul 11, 2019
- Samsung Electronics Co., Ltd.
- Sung-yoon RYU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING SEMICONDUCTOR DEVICE
- Publication number 20180202942
- Publication date Jul 19, 2018
- Samsung Electronics Co., Ltd.
- Hyo Hyeong KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL INSPECTION APPARATUS AND METHOD AND METHOD OF FABRICATING S...
- Publication number 20180144995
- Publication date May 24, 2018
- Samsung Electronics Co., Ltd.
- Young-Duk Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING SURFACE AND METHOD OF MANUFACTURING SEMICONDUC...
- Publication number 20180061718
- Publication date Mar 1, 2018
- Samsung Electronics Co., Ltd.
- Sung-yoon RYU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF INSPECTING SUBSTRATES AND SEMICONDUCTOR FABRICATION METH...
- Publication number 20170200658
- Publication date Jul 13, 2017
- Samsung Electronics Co., Ltd.
- Yusin Yang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING OVERLAY ERROR AND METHOD FOR MANUFACTURING SEM...
- Publication number 20160300767
- Publication date Oct 13, 2016
- Kang-Woong Ko
- G01 - MEASURING TESTING
Information Patent Application
Surface Inspecting Method
- Publication number 20160153915
- Publication date Jun 2, 2016
- Samsung Electronics Co., Ltd.
- Kang-woong Ko
- G01 - MEASURING TESTING
Information Patent Application
ELLIPSOMETER FOR DETECTING SURFACE
- Publication number 20150077750
- Publication date Mar 19, 2015
- Samsung Electronics Co., Ltd.
- Kang-woong KO
- G01 - MEASURING TESTING

Gil-Woo SONG

Person

Patents Grantslast 30 patents

Method of inspecting surface and method of manufacturing semiconduc...

Method for measuring semiconductor device

Method of inspecting surface and method of manufacturing semiconduc...

Surface inspecting method

Method for detecting overlay error and method for manufacturing sem...

Ellipsometer for detecting surface

Patents Applicationslast 30 patents

METHOD OF INSPECTING SURFACE AND METHOD OF MANUFACTURING SEMICONDUC...

METHOD FOR MEASURING SEMICONDUCTOR DEVICE

OPTICAL INSPECTION APPARATUS AND METHOD AND METHOD OF FABRICATING S...

METHOD OF INSPECTING SURFACE AND METHOD OF MANUFACTURING SEMICONDUC...

METHODS OF INSPECTING SUBSTRATES AND SEMICONDUCTOR FABRICATION METH...

METHOD FOR DETECTING OVERLAY ERROR AND METHOD FOR MANUFACTURING SEM...

Surface Inspecting Method

ELLIPSOMETER FOR DETECTING SURFACE