Gilad Almogy

Person

Kiryat-Ono, IL

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for defect localization on electrical test struct...
- Patent number 7,969,564
- Issue date Jun 28, 2011
- Applied Materials Israel, Ltd.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
High resolution printer and a method for high resolution printing
- Patent number 7,846,649
- Issue date Dec 7, 2010
- Applied Materials Israel, Ltd.
- Ehud Tirosh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,842,935
- Issue date Nov 30, 2010
- Applied Materials Israel, Ltd.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for defect detection using computer aided design data
- Patent number 7,801,353
- Issue date Sep 21, 2010
- Applied Materials Israel, Ltd.
- Gilad Almogy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design-based method for grouping systematic defects in lithography...
- Patent number 7,760,347
- Issue date Jul 20, 2010
- Applied Materials, Inc.
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of reducing critical dimension bias during fabrication of a...
- Patent number 7,737,040
- Issue date Jun 15, 2010
- Applied Materials, Inc.
- Christopher Dennis Bencher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automatic optical inspection using multiple objectives
- Patent number 7,599,075
- Issue date Oct 6, 2009
- Applied Materials, Israel, Ltd.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,521,700
- Issue date Apr 21, 2009
- Applied Materials, Israel, Ltd.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process and assembly for non-destructive surface inspection
- Patent number 7,463,351
- Issue date Dec 9, 2008
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
System and method for process variation monitor
- Patent number 7,410,737
- Issue date Aug 12, 2008
- Applied Materials Israel, Ltd.
- Evgeni Levin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Printer and a method for recording a multi-level image
- Patent number 7,379,161
- Issue date May 27, 2008
- Applied Materials, Israel, Ltd.
- Gilad Almogy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle fabrication using a removable hard mask
- Patent number 7,365,014
- Issue date Apr 29, 2008
- Applied Materials, Inc.
- Christopher Dennis Bencher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automatic optical inspection using multiple objectives
- Patent number 7,355,689
- Issue date Apr 8, 2008
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for optical inspection of surfaces based on las...
- Patent number 7,342,218
- Issue date Mar 11, 2008
- Applied Materials, Israel, Ltd.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,098,468
- Issue date Aug 29, 2006
- Applied Materials, Inc.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for process variation monitor
- Patent number 7,054,480
- Issue date May 30, 2006
- Applied Materials Israel, Ltd.
- Evgeni Levin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Printer and a method for recording a multi-level image
- Patent number 7,053,985
- Issue date May 30, 2006
- Applied Materials, Isreal, Ltd.
- Gilad Almogy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Spot grid array electron imaging system
- Patent number 6,946,655
- Issue date Sep 20, 2005
- Applied Materials, Inc.
- Gilad Almogy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect detection with enhanced dynamic range
- Patent number 6,914,670
- Issue date Jul 5, 2005
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Optical spot grid array printer
- Patent number 6,897,941
- Issue date May 24, 2005
- Applied Materials, Inc.
- Gilad Almogy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process and assembly for non-destructive surface inspection
- Patent number 6,861,660
- Issue date Mar 1, 2005
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
System and method for process variation monitor
- Patent number 6,862,491
- Issue date Mar 1, 2005
- Applied Materials Israel, Ltd.
- Evgeni Levin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Variable angle illumination wafer inspection system
- Patent number 6,853,446
- Issue date Feb 8, 2005
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Maskless photon-electron spot-grid array printer
- Patent number 6,841,787
- Issue date Jan 11, 2005
- Applied Materials, Inc.
- Gilad Almogy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser scanning wafer inspection using nonlinear optical phenomena
- Patent number 6,791,099
- Issue date Sep 14, 2004
- Applied Materials, Inc.
- Daniel I. Some
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of patterned semiconductor wafers
- Patent number 6,671,398
- Issue date Dec 30, 2003
- Applied Materials, Inc.
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Grant
Multiple beam scanner for an inspection system
- Patent number 6,671,042
- Issue date Dec 30, 2003
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection with enhanced dynamic range
- Patent number 6,657,714
- Issue date Dec 2, 2003
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Spot grid array imaging system
- Patent number 6,639,201
- Issue date Oct 28, 2003
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Inspection systems performing two-dimensional imaging with line lig...
- Patent number 6,587,193
- Issue date Jul 1, 2003
- Applied Materials, Inc.
- Silviu Reinhron
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20110141462
- Publication date Jun 16, 2011
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC OPTICAL INSPECTION USING MULTIPLE OBJECTIVES
- Publication number 20080186556
- Publication date Aug 7, 2008
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
Method of reducing critical dimension bias during fabrication of a...
- Publication number 20080096138
- Publication date Apr 24, 2008
- APPLIED MATERIALS, INC.
- Christopher Dennis Bencher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR DEFECT DETECTION USING COMPUTER AIDED DESIGN DATA
- Publication number 20070280527
- Publication date Dec 6, 2007
- Gilad Almogy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN-BASED METHOD FOR GROUPING SYSTEMATIC DEFECTS IN LITHOGRAPHY...
- Publication number 20060269120
- Publication date Nov 30, 2006
- YOUVAL NEHMADI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Raster Frame Beam System For Electron Beam Lithography
- Publication number 20060243918
- Publication date Nov 2, 2006
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Raster Frame Beam System For Electron Beam Lithography
- Publication number 20060243922
- Publication date Nov 2, 2006
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Printer and a method for recording a multi-level image
- Publication number 20060197931
- Publication date Sep 7, 2006
- Gilad Almogy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and method for defect localization on electrical test struct...
- Publication number 20060192904
- Publication date Aug 31, 2006
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PROCESS VARIATION MONITOR
- Publication number 20060182335
- Publication date Aug 17, 2006
- Evgeni Levin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic optical inspection using multiple objectives
- Publication number 20060170910
- Publication date Aug 3, 2006
- Applied Materials Israel, Ltd.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
High resolution printer and a method for high resolution printing
- Publication number 20060055911
- Publication date Mar 16, 2006
- Applied Materials Israel Ltd.
- Ehud Tirosh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Wafer inspection system
- Publication number 20060012791
- Publication date Jan 19, 2006
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Application
Raster frame beam system for electron beam lithography
- Publication number 20050274911
- Publication date Dec 15, 2005
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Process and assmebly for non-destructive surface inspection
- Publication number 20050179891
- Publication date Aug 18, 2005
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
Reticle fabrication using a removable hard mask
- Publication number 20050170655
- Publication date Aug 4, 2005
- Christopher Dennis Bencher
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and method for process variation monitor
- Publication number 20050122510
- Publication date Jun 9, 2005
- Evgeni Levin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Eliminating coherence effects in bright-field laser imaging
- Publication number 20040119001
- Publication date Jun 24, 2004
- Applied Materials Israel Ltd.
- Gilad Almogy
- G02 - OPTICS
Information Patent Application
Printer and a method for recording a multi-level image
- Publication number 20040090675
- Publication date May 13, 2004
- Applied Materials Israel Ltd.
- Gilad Almogy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Spot grid array imaging system
- Publication number 20040061042
- Publication date Apr 1, 2004
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
Process and assembly for non-destructive surface inspection
- Publication number 20040016896
- Publication date Jan 29, 2004
- Applied Materials Israel, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
System and method for process variation monitor
- Publication number 20030219153
- Publication date Nov 27, 2003
- Applied Materials Israel Ltd.
- Evgeni Levin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Maskless photon-electron spot-grid array printer
- Publication number 20030122091
- Publication date Jul 3, 2003
- Gilad Almogy
- B82 - NANO-TECHNOLOGY
Information Patent Application
Optical spot grid array printer
- Publication number 20030123040
- Publication date Jul 3, 2003
- Gilad Almogy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Spot grid array electron imaging system
- Publication number 20030085353
- Publication date May 8, 2003
- Gilad Almogy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Spot grid array imaging system
- Publication number 20030085335
- Publication date May 8, 2003
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
Defect detection with enhanced dynamic range
- Publication number 20030058433
- Publication date Mar 27, 2003
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
Laser scanning wafer inspection using nonlinear optical phenomena
- Publication number 20020109110
- Publication date Aug 15, 2002
- APPLIED MATERIALS, INC.
- Daniel I. Some
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspection of patterned semiconductor wafers
- Publication number 20020034325
- Publication date Mar 21, 2002
- APPLIED MATERIALS, INC.
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection method and apparatus utilizing a variable angle...
- Publication number 20020005947
- Publication date Jan 17, 2002
- APPLIED MATERIALS, INC.
- Boris Golberg
- G01 - MEASURING TESTING

Gilad Almogy

Person

Patents Grantslast 30 patents

System and method for defect localization on electrical test struct...

High resolution printer and a method for high resolution printing

Raster frame beam system for electron beam lithography

Method for defect detection using computer aided design data

Design-based method for grouping systematic defects in lithography...

Method of reducing critical dimension bias during fabrication of a...

Automatic optical inspection using multiple objectives

Raster frame beam system for electron beam lithography

Process and assembly for non-destructive surface inspection

System and method for process variation monitor

Printer and a method for recording a multi-level image

Reticle fabrication using a removable hard mask

Automatic optical inspection using multiple objectives

Methods and systems for optical inspection of surfaces based on las...

Raster frame beam system for electron beam lithography

System and method for process variation monitor

Printer and a method for recording a multi-level image

Spot grid array electron imaging system

Defect detection with enhanced dynamic range

Optical spot grid array printer

Process and assembly for non-destructive surface inspection

System and method for process variation monitor

Variable angle illumination wafer inspection system

Maskless photon-electron spot-grid array printer

Laser scanning wafer inspection using nonlinear optical phenomena

Method and apparatus for inspection of patterned semiconductor wafers

Multiple beam scanner for an inspection system

Defect detection with enhanced dynamic range

Spot grid array imaging system

Inspection systems performing two-dimensional imaging with line lig...

Patents Applicationslast 30 patents

WAFER INSPECTION SYSTEM

AUTOMATIC OPTICAL INSPECTION USING MULTIPLE OBJECTIVES

Method of reducing critical dimension bias during fabrication of a...

METHOD FOR DEFECT DETECTION USING COMPUTER AIDED DESIGN DATA

DESIGN-BASED METHOD FOR GROUPING SYSTEMATIC DEFECTS IN LITHOGRAPHY...

Raster Frame Beam System For Electron Beam Lithography

Raster Frame Beam System For Electron Beam Lithography

Printer and a method for recording a multi-level image

System and method for defect localization on electrical test struct...

SYSTEM AND METHOD FOR PROCESS VARIATION MONITOR

Automatic optical inspection using multiple objectives

High resolution printer and a method for high resolution printing

Wafer inspection system

Raster frame beam system for electron beam lithography

Process and assmebly for non-destructive surface inspection

Reticle fabrication using a removable hard mask

System and method for process variation monitor

Eliminating coherence effects in bright-field laser imaging

Printer and a method for recording a multi-level image

Spot grid array imaging system

Process and assembly for non-destructive surface inspection

System and method for process variation monitor

Maskless photon-electron spot-grid array printer

Optical spot grid array printer

Spot grid array electron imaging system

Spot grid array imaging system

Defect detection with enhanced dynamic range

Laser scanning wafer inspection using nonlinear optical phenomena

Method and apparatus for inspection of patterned semiconductor wafers

Optical inspection method and apparatus utilizing a variable angle...