Gilad BARAK

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Hybrid metrology method and system
- Patent number 12,366,533
- Issue date Jul 22, 2025
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical metrology system and method
- Patent number 12,360,462
- Issue date Jul 15, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for optical metrology
- Patent number 12,359,968
- Issue date Jul 15, 2025
- Nova Ltd.
- Yonatan Oren
- G01 - MEASURING TESTING
Information Patent Grant
Optical technique for material characterization
- Patent number 12,298,182
- Issue date May 13, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 12,196,691
- Issue date Jan 14, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Accurate Raman spectroscopy
- Patent number 12,163,892
- Issue date Dec 10, 2024
- Nova Ltd.
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Grant
Accurate Raman spectroscopy
- Patent number 12,152,993
- Issue date Nov 26, 2024
- Nova Ltd.
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectroscopy based measurements in patterned structures
- Patent number 12,066,385
- Issue date Aug 20, 2024
- Nova Ltd.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid metrology method and system
- Patent number 12,025,560
- Issue date Jul 2, 2024
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical phase measurement system and method
- Patent number 11,946,875
- Issue date Apr 2, 2024
- Nova Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical technique for material characterization
- Patent number 11,927,481
- Issue date Mar 12, 2024
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical characterization of patterned samples
- Patent number 11,885,737
- Issue date Jan 30, 2024
- Nova Ltd.
- Dror Shafir
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology system and method
- Patent number 11,868,054
- Issue date Jan 9, 2024
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Accurate raman spectroscopy
- Patent number 11,860,104
- Issue date Jan 2, 2024
- Nova Ltd.
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for broadband photoreflectance spectroscopy
- Patent number 11,802,829
- Issue date Oct 31, 2023
- Nova Ltd.
- Yonatan Oren
- G01 - MEASURING TESTING
Information Patent Grant
Accurate Raman spectroscopy
- Patent number 11,740,183
- Issue date Aug 29, 2023
- Nova Ltd.
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 11,692,953
- Issue date Jul 4, 2023
- Nova Ltd.
- Gilad Barak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test structure design for metrology measurements in patterned samples
- Patent number 11,639,901
- Issue date May 2, 2023
- Nova Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical technique for material characterization
- Patent number 11,543,294
- Issue date Jan 3, 2023
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement system and method
- Patent number 11,460,415
- Issue date Oct 4, 2022
- Nova Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Accurate Raman spectroscopy
- Patent number 11,415,519
- Issue date Aug 16, 2022
- Nova Ltd.
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Grant
Time-domain optical metrology and inspection of semiconductor devices
- Patent number 11,366,398
- Issue date Jun 21, 2022
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectroscopy based measurements in patterned structures
- Patent number 11,275,027
- Issue date Mar 15, 2022
- Nova Ltd.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid metrology method and system
- Patent number 11,150,190
- Issue date Oct 19, 2021
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Test structure design for metrology measurements in patterned samples
- Patent number 11,143,601
- Issue date Oct 12, 2021
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 11,099,142
- Issue date Aug 24, 2021
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 11,029,258
- Issue date Jun 8, 2021
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical characterization of patterned samples
- Patent number 10,876,959
- Issue date Dec 29, 2020
- Nova Measuring Instruments Ltd.
- Dror Shafir
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical metrology in patterned structures
- Patent number 10,761,036
- Issue date Sep 1, 2020
- Nova Measuring Instruments Ltd.
- Boris Levant
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid metrology method and system
- Patent number 10,732,116
- Issue date Aug 4, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
COMBINED PHOTOTHERMAL AND OCD FOR SEMI-OPAQUE STRUCTURES
- Publication number 20250207909
- Publication date Jun 26, 2025
- NOVA LTD
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20250130172
- Publication date Apr 24, 2025
- NOVA LTD
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
- Publication number 20250123210
- Publication date Apr 17, 2025
- NOVA LTD
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20250116605
- Publication date Apr 10, 2025
- NOVA LTD
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING PARAMETERS OF PATTERNED STRUCTURE...
- Publication number 20250067683
- Publication date Feb 27, 2025
- NOVA LTD
- Amir Shayari
- G01 - MEASURING TESTING
Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20250003882
- Publication date Jan 2, 2025
- NOVA LTD
- GILAD BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20240337590
- Publication date Oct 10, 2024
- NOVA LTD
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION
- Publication number 20240295436
- Publication date Sep 5, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY TECHNIQUE FOR SEMICONDUCTOR DEVICES
- Publication number 20240271926
- Publication date Aug 15, 2024
- NOVA LTD
- Dror SHAFIR
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY SYSTEM AND METHOD
- Publication number 20240264538
- Publication date Aug 8, 2024
- NOVA LTD
- Gilad BARAK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20240210322
- Publication date Jun 27, 2024
- NOVA LTD
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20240085333
- Publication date Mar 14, 2024
- NOVA LTD
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
- Publication number 20240085805
- Publication date Mar 14, 2024
- NOVA LTD
- Gilad BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE
- Publication number 20240044819
- Publication date Feb 8, 2024
- NOVA LTD
- Gilad Barak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20240019375
- Publication date Jan 18, 2024
- NOVA LTD
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR OPTICAL METROLOGY
- Publication number 20230296436
- Publication date Sep 21, 2023
- NOVA LTD
- Yonatan OREN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION
- Publication number 20230296434
- Publication date Sep 21, 2023
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20230168200
- Publication date Jun 1, 2023
- NOVA LTD
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD
- Publication number 20230130231
- Publication date Apr 27, 2023
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY SYSTEM AND METHOD
- Publication number 20230124422
- Publication date Apr 20, 2023
- NOVA LTD
- Gilad BARAK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20230044886
- Publication date Feb 9, 2023
- NOVA MEASURING INSTRUMENTS LTD.
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Application
COMBINED OCD AND PHOTOREFLECTANCE METHOD AND SYSTEM
- Publication number 20230035404
- Publication date Feb 2, 2023
- NOVA LTD
- Yonatan OREN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR BROADBAND PHOTOREFLECTANCE SPECTROSCOPY
- Publication number 20230003637
- Publication date Jan 5, 2023
- NOVA LTD
- Yonatan OREN
- G01 - MEASURING TESTING
Information Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
- Publication number 20220390858
- Publication date Dec 8, 2022
- NOVA LTD
- GILAD BARAK
- G01 - MEASURING TESTING
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
- Publication number 20220326159
- Publication date Oct 13, 2022
- NOVA LTD
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20220120690
- Publication date Apr 21, 2022
- NOVA LTD
- GILAD BARAK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES
- Publication number 20220099596
- Publication date Mar 31, 2022
- NOVA LTD
- GILAD BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE
- Publication number 20220042934
- Publication date Feb 10, 2022
- NOVA LTD
- Gilad Barak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20210364451
- Publication date Nov 25, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING

Gilad BARAK

Person

Patents Grantslast 30 patents

Hybrid metrology method and system

Optical metrology system and method

Systems and methods for optical metrology

Optical technique for material characterization

X-ray based measurements in patterned structure

Accurate Raman spectroscopy

Accurate Raman spectroscopy

Raman spectroscopy based measurements in patterned structures

Hybrid metrology method and system

Optical phase measurement system and method

Optical technique for material characterization

Method and system for optical characterization of patterned samples

Optical metrology system and method

Accurate raman spectroscopy

Method and system for broadband photoreflectance spectroscopy

Accurate Raman spectroscopy

X-ray based measurements in patterned structure

Test structure design for metrology measurements in patterned samples

Optical technique for material characterization

Optical phase measurement system and method

Accurate Raman spectroscopy

Time-domain optical metrology and inspection of semiconductor devices

Raman spectroscopy based measurements in patterned structures

Hybrid metrology method and system

Test structure design for metrology measurements in patterned samples

X-ray based measurements in patterned structure

Optical phase measurement method and system

Method and system for optical characterization of patterned samples

Method and system for optical metrology in patterned structures

Hybrid metrology method and system

Patents Applicationslast 30 patents

COMBINED PHOTOTHERMAL AND OCD FOR SEMI-OPAQUE STRUCTURES

ACCURATE RAMAN SPECTROSCOPY

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES

ACCURATE RAMAN SPECTROSCOPY

SYSTEM AND METHOD FOR DETERMINING PARAMETERS OF PATTERNED STRUCTURE...

HYBRID METROLOGY METHOD AND SYSTEM

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES

OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION

METROLOGY TECHNIQUE FOR SEMICONDUCTOR DEVICES

OPTICAL METROLOGY SYSTEM AND METHOD

ACCURATE RAMAN SPECTROSCOPY

ACCURATE RAMAN SPECTROSCOPY

TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES

X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE

ACCURATE RAMAN SPECTROSCOPY

SYSTEMS AND METHODS FOR OPTICAL METROLOGY

OPTICAL TECHNIQUE FOR MATERIAL CHARACTERIZATION

ACCURATE RAMAN SPECTROSCOPY

OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD

OPTICAL METROLOGY SYSTEM AND METHOD

ACCURATE RAMAN SPECTROSCOPY

COMBINED OCD AND PHOTOREFLECTANCE METHOD AND SYSTEM

METHOD AND SYSTEM FOR BROADBAND PHOTOREFLECTANCE SPECTROSCOPY

TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES

HYBRID METROLOGY METHOD AND SYSTEM

TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES

X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM