Gilad Golan

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Rishon Le-Zion, IL

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Patents Grantslast 30 patents

Information Patent Grant
Scanning mechanism for high-speed high-resolution scanning
- Patent number 7,037,012
- Issue date May 2, 2006
- Ziv-Av Engineering Ltd.
- Jacob Karin
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Circular scanning patterns
- Patent number 6,603,589
- Issue date Aug 5, 2003
- Tokyo Seimitsu (Israel) Ltd.
- Jacob Karin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electron microscope array for inspection and lithography
- Publication number 20060033035
- Publication date Feb 16, 2006
- Mordechai Itzkovitch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning mechanism for high-speed high-resolution scanning
- Publication number 20040165923
- Publication date Aug 26, 2004
- ACCRETECH (ISRAEL) LTD
- Jacob Karin
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Circular scanning patterns
- Publication number 20030099022
- Publication date May 29, 2003
- Tokyo Seimitsu (Israel) Ltd.
- Jacob Karin
- G01 - MEASURING TESTING
Information Patent Application
Tilted scan for Die-to-Die and Cell-to-Cell detection
- Publication number 20030081826
- Publication date May 1, 2003
- Tokyo Seimitsu (Israel) Ltd.
- Jacob Karin
- G06 - COMPUTING CALCULATING COUNTING