Gilad Laredo

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Sensitive optical metrology in scanning and static modes
- Patent number 11,933,717
- Issue date Mar 19, 2024
- KLA Corporation
- Andrew V. Hill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology target for scanning metrology
- Patent number 11,073,768
- Issue date Jul 27, 2021
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sensitive Optical Metrology in Scanning and Static Modes
- Publication number 20210096061
- Publication date Apr 1, 2021
- KLA Corporation
- Andrew V. Hill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology Target for Scanning Metrology
- Publication number 20200409271
- Publication date Dec 31, 2020
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING