Gilad Laredo

Person

Migdal HaEmek, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of measuring misregistration in the manufacture of topograph...
- Patent number 11,880,141
- Issue date Jan 23, 2024
- KLA Corporation
- Daria Negri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for measuring misregistration of semiconductor de...
- Patent number 11,573,497
- Issue date Feb 7, 2023
- KLA Corporation
- Daria Negri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging system for buried metrology targets
- Patent number 11,512,948
- Issue date Nov 29, 2022
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Measurement modes for overlay
- Patent number 11,346,657
- Issue date May 31, 2022
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive focusing system for a scanning metrology tool
- Patent number 11,333,616
- Issue date May 17, 2022
- Gilad Laredo
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring misregistration in the manufacture of topograph...
- Patent number 11,281,112
- Issue date Mar 22, 2022
- KLA Corporation
- Daria Negri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Off-axis illumination overlay measurement using two-diffracted orde...
- Patent number 11,281,111
- Issue date Mar 22, 2022
- KLA-Tencor Corporation
- Yoni Shalibo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MASSIVE OVERLAY METROLOGY SAMPLING WITH MULTIPLE MEASUREMENT COLUMNS
- Publication number 20230359129
- Publication date Nov 9, 2023
- Jonathan Madsen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING MISREGISTRATION IN THE MANUFACTURE OF TOPOGRAPH...
- Publication number 20220171296
- Publication date Jun 2, 2022
- KLA Corporation
- Daria Negri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Adaptive Focusing System for a Scanning Metrology Tool
- Publication number 20220034820
- Publication date Feb 3, 2022
- KLA Corporation
- Gilad Laredo
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM FOR BURIED METROLOGY TARGETS
- Publication number 20210372784
- Publication date Dec 2, 2021
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Application
Measurement Modes for Overlay
- Publication number 20210364279
- Publication date Nov 25, 2021
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY TARGET FOR SCANNING METROLOGY
- Publication number 20210311401
- Publication date Oct 7, 2021
- KLA Corporation
- Andrew V. Hill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MEASURING MISREGISTRATION IN THE MANUFACTURE OF TOPOGRAPH...
- Publication number 20210200104
- Publication date Jul 1, 2021
- KLA Corporation
- Daria Negri
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR MEASURING MISREGISTRATION OF SEMICONDUCTOR DE...
- Publication number 20210191279
- Publication date Jun 24, 2021
- KLA Corporation
- Daria Negri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OFF-AXIS ILLUMINATION OVERLAY MEASUREMENT USING TWO-DIFFRACTED ORDE...
- Publication number 20200132446
- Publication date Apr 30, 2020
- KLA-Tencor Corporation
- Yoni Shalibo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Gilad Laredo

Person

Patents Grantslast 30 patents

Method of measuring misregistration in the manufacture of topograph...

System and method for measuring misregistration of semiconductor de...

Imaging system for buried metrology targets

Measurement modes for overlay

Adaptive focusing system for a scanning metrology tool

Method of measuring misregistration in the manufacture of topograph...

Off-axis illumination overlay measurement using two-diffracted orde...

Patents Applicationslast 30 patents

MASSIVE OVERLAY METROLOGY SAMPLING WITH MULTIPLE MEASUREMENT COLUMNS

METHOD OF MEASURING MISREGISTRATION IN THE MANUFACTURE OF TOPOGRAPH...

Adaptive Focusing System for a Scanning Metrology Tool

IMAGING SYSTEM FOR BURIED METROLOGY TARGETS

Measurement Modes for Overlay

METROLOGY TARGET FOR SCANNING METROLOGY

METHOD OF MEASURING MISREGISTRATION IN THE MANUFACTURE OF TOPOGRAPH...

SYSTEM AND METHOD FOR MEASURING MISREGISTRATION OF SEMICONDUCTOR DE...

OFF-AXIS ILLUMINATION OVERLAY MEASUREMENT USING TWO-DIFFRACTED ORDE...