Gilad Schwartz

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Meishar, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspecting a sample having a controller fo...
- Patent number 7,504,647
- Issue date Mar 17, 2009
- Applied Materials, Inc.
- Gal Amar
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a sample having a height measur...
- Patent number 7,115,890
- Issue date Oct 3, 2006
- Applied Materials, Inc.
- Gal Amar
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for line alignment to compensate for static...
- Patent number 6,831,736
- Issue date Dec 14, 2004
- Applied Materials Israel, Ltd.
- Rami Elichai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection System with Auto-Focus
- Publication number 20070034773
- Publication date Feb 15, 2007
- Gal Amar
- G01 - MEASURING TESTING
Information Patent Application
Inspection system with auto-focus
- Publication number 20050167568
- Publication date Aug 4, 2005
- Gal Amar
- G01 - MEASURING TESTING
Information Patent Application
Method of and apparatus for line alignment to compensate for static...
- Publication number 20040066506
- Publication date Apr 8, 2004
- Applied Materials Israel Ltd.
- Rami Elichai
- G01 - MEASURING TESTING