Gilad Shomrony

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Kfar-Saba, IL

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Patents Grantslast 30 patents

Information Patent Grant
Optical inspection including partial scanning of wafers
- Patent number 7,924,420
- Issue date Apr 12, 2011
- Applied Materials South East Asia Pte. Ltd.
- Gilad Shomrony
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical Inspection Including Partial Scanning of Wafers
- Publication number 20080307908
- Publication date Dec 18, 2008
- Gilad Shomrony
- G01 - MEASURING TESTING