Gilbert Cadopi

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Vence, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method and systems to measure propagation delay in semiconductor chips
- Patent number 6,807,509
- Issue date Oct 19, 2004
- International Business Machines Corporation
- Laurence Bourdin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and systems to measure propagation delay in semiconductor chips
- Publication number 20030107393
- Publication date Jun 12, 2003
- International Business Machines Corporation
- Laurence Bourdin
- G01 - MEASURING TESTING