Gilles Festes

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Fuveau, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method of determining defective die containing non-volatile memory...
- Patent number 12,020,762
- Issue date Jun 25, 2024
- Silicon Storage Technology, Inc.
- Yuri Tkachev
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of forming split gate memory cells with thinned side edge tu...
- Patent number 11,362,218
- Issue date Jun 14, 2022
- Silicon Storage Technology, Inc.
- Jinho Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming split gate memory cells with thinned tunnel oxide
- Patent number 11,018,147
- Issue date May 25, 2021
- Silicon Storage Technology, Inc.
- Jinho Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Split-gate flash memory cell with improved read performance
- Patent number 10,847,225
- Issue date Nov 24, 2020
- Microchip Technology Incorporated
- Sonu Daryanani
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE WITH COMMUNICATION RING
- Publication number 20240274591
- Publication date Aug 15, 2024
- Silicon Storage Technology, Inc.
- Jinho KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Determining Defective Die Containing Non-volatile Memory...
- Publication number 20230101585
- Publication date Mar 30, 2023
- Silicon Storage Technology, Inc.
- Yuri Tkachev
- G11 - INFORMATION STORAGE
Information Patent Application
Method Of Forming Split Gate Memory Cells With Thinned Side Edge Tu...
- Publication number 20210399127
- Publication date Dec 23, 2021
- Silicon Storage Technology, Inc.
- Jinho Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Split-Gate Flash Memory Cell With Improved Read Performance
- Publication number 20190392899
- Publication date Dec 26, 2019
- MICROCHIP TECHNOLOGY INCORPORATED
- Sonu Daryanani
- H01 - BASIC ELECTRIC ELEMENTS