Gilles Fresquet

Person

Garrigues Sainte Eulalie, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Method for 2D/3D inspection of an object such as a wafer
- Patent number 10,240,977
- Issue date Mar 26, 2019
- UNITY SEMICONDUCTOR
- Gilles Fresquet
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for making dimensional measurements on multilayer...
- Patent number 10,074,172
- Issue date Sep 11, 2018
- UNITY SEMICONDUCTOR
- Gilles Fresquet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for controllably revealing structures buried in o...
- Patent number 10,043,266
- Issue date Aug 7, 2018
- UNITY SEMICONDUCTOR
- Gilles Fresquet
- B24 - GRINDING POLISHING
Information Patent Grant
Device and method for surface profilometry for the control of wafer...
- Patent number 9,958,261
- Issue date May 1, 2018
- UNITY SEMICONDUCTOR
- Gilles Fresquet
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for positioning a photolithography mask by a cont...
- Patent number 9,897,927
- Issue date Feb 20, 2018
- UNITY SEMICONDUCTOR
- Gilles Fresquet
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Chromatic confocal device and method for 2D/3D inspection of an obj...
- Patent number 9,739,600
- Issue date Aug 22, 2017
- UNITY SEMICONDUCTOR
- Gilles Fresquet
- G01 - MEASURING TESTING
Information Patent Grant
Chromatic confocal device and method for 2D/3D inspection of an obj...
- Patent number 9,494,529
- Issue date Nov 15, 2016
- FOGALE NANOTECH
- Gilles Fresquet
- G01 - MEASURING TESTING
Information Patent Grant
Optical device and method for inspecting structured objects
- Patent number 9,151,941
- Issue date Oct 6, 2015
- Nanotec Solution
- Gilles Fresquet
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR IMAGING AND INTERFEROMETRY MEASUREMENTS
- Publication number 20220397392
- Publication date Dec 15, 2022
- FOGALE NANOTECH
- Alain COURTEVILLE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
- Publication number 20220136822
- Publication date May 5, 2022
- Gilles FRESQUET
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR SURFACE PROFILOMETRY FOR THE CONTROL OF WAFER...
- Publication number 20170299376
- Publication date Oct 19, 2017
- FOGALE NANOTECH
- Gilles FRESQUET
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR 2D/3D INSPECTION OF AN OBJECT SUCH AS A WAFER
- Publication number 20170276615
- Publication date Sep 28, 2017
- FOGALE NANOTECH
- Gilles FRESQUET
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR POSITIONING A PHOTOLITHOGRAPHY MASK BY A CONT...
- Publication number 20160377995
- Publication date Dec 29, 2016
- FOGALE NANOTECH
- Gilles FRESQUET
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEVICE AND METHOD FOR MAKING DIMENSIONAL MEASUREMENTS ON MULTILAYER...
- Publication number 20150243024
- Publication date Aug 27, 2015
- FOGALE NANOTECH
- Gilles Fresquet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR CONTROLLABLY REVEALING STRUCTURES BURIED IN O...
- Publication number 20150228069
- Publication date Aug 13, 2015
- FOGALE NANOTECH
- Gilles Fresquet
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE AND METHOD FOR INSPECTING STRUCTURED OBJECTS
- Publication number 20130038863
- Publication date Feb 14, 2013
- Nanotec Solution
- Gilles Fresquet
- G02 - OPTICS

Gilles Fresquet

Person

Patents Grantslast 30 patents

Method for 2D/3D inspection of an object such as a wafer

Device and method for making dimensional measurements on multilayer...

Method and device for controllably revealing structures buried in o...

Device and method for surface profilometry for the control of wafer...

Device and method for positioning a photolithography mask by a cont...

Chromatic confocal device and method for 2D/3D inspection of an obj...

Chromatic confocal device and method for 2D/3D inspection of an obj...

Optical device and method for inspecting structured objects

Patents Applicationslast 30 patents

DEVICE AND METHOD FOR IMAGING AND INTERFEROMETRY MEASUREMENTS

METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

DEVICE AND METHOD FOR SURFACE PROFILOMETRY FOR THE CONTROL OF WAFER...

METHOD FOR 2D/3D INSPECTION OF AN OBJECT SUCH AS A WAFER

DEVICE AND METHOD FOR POSITIONING A PHOTOLITHOGRAPHY MASK BY A CONT...

DEVICE AND METHOD FOR MAKING DIMENSIONAL MEASUREMENTS ON MULTILAYER...

METHOD AND DEVICE FOR CONTROLLABLY REVEALING STRUCTURES BURIED IN O...

OPTICAL DEVICE AND METHOD FOR INSPECTING STRUCTURED OBJECTS