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Giovanni Carlo Tripoli
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Patents Grants
last 30 patents
Information
Patent Grant
Oscillator circuit, and related integrated circuit
Patent number
10,630,267
Issue date
Apr 21, 2020
STMicroelectronics S.r.l.
Giovanni Carlo Tripoli
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and system for compensating systematic non-linearities of a...
Patent number
9,970,958
Issue date
May 15, 2018
STMicroelectronics S.r.l.
Marco Castellano
G01 - MEASURING TESTING
Information
Patent Grant
Method and a device for analog-to-digital conversion of signals, co...
Patent number
9,755,658
Issue date
Sep 5, 2017
STMicroelectronics S.r.l.
Matteo Quartiroli
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Configurable analog front-end for mutual capacitance sensing and se...
Patent number
9,523,725
Issue date
Dec 20, 2016
STMicroelectronics Asia Pacific PTE Ltd.
Kien Beng Tan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for analog-to-digital conversion of signals, corr...
Patent number
9,455,732
Issue date
Sep 27, 2016
STMicroelectronics S.r.l.
Matteo Quartiroli
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
High signal to noise ratio capacitive sensing analog front-end
Patent number
9,389,256
Issue date
Jul 12, 2016
STMicroelectronics Asia Pacific PTE Ltd.
Paolo Angelini
G01 - MEASURING TESTING
Information
Patent Grant
High signal to noise ratio capacitive sensing analog front-end
Patent number
9,128,573
Issue date
Sep 8, 2015
STMicroelectronics S.R.L.
Paolo Angelini
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Configurable analog front-end for mutual capacitance sensing and se...
Patent number
8,976,151
Issue date
Mar 10, 2015
STMicroelectronics Asia Pacific PTE Ltd.
Kien Beng Tan
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing a microelectromechanical device, microelectromec...
Patent number
8,661,871
Issue date
Mar 4, 2014
STMicroelectronics S.r.l.
Giovanni Carlo Tripoli
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OSCILLATOR CIRCUIT, AND RELATED INTEGRATED CIRCUIT
Publication number
20190222203
Publication date
Jul 18, 2019
STMicroelectronics S.r.l.
Giovanni Carlo Tripoli
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD AND A DEVICE FOR ANALOG-TO-DIGITAL CONVERSION OF SIGNALS, CO...
Publication number
20170012635
Publication date
Jan 12, 2017
STMicroelectronics S.r.l.
Matteo Quartiroli
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHOD AND DEVICE FOR ANALOG-TO-DIGITAL CONVERSION OF SIGNALS, CORR...
Publication number
20160182071
Publication date
Jun 23, 2016
STMicroelectronics S.r.l.
Matteo Quartiroli
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHOD AND SYSTEM FOR COMPENSATING SYSTEMATIC NON-LINEARITIES OF A...
Publication number
20150323560
Publication date
Nov 12, 2015
STMicroelectronics S.r.l.
Marco Castellano
G01 - MEASURING TESTING
Information
Patent Application
HIGH SIGNAL TO NOISE RATIO CAPACITIVE SENSING ANALOG FRONT-END
Publication number
20150145801
Publication date
May 28, 2015
STMicroelectronics Asia Pacific Pte. Ltd.
Paolo Angelini
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONFIGURABLE ANALOG FRONT-END FOR MUTUAL CAPACITANCE SENSING AND SE...
Publication number
20140312919
Publication date
Oct 23, 2014
STMicroelectronics Asia Pacific Pte. Ltd.
Kien Beng Tan
G01 - MEASURING TESTING
Information
Patent Application
CONFIGURABLE ANALOG FRONT-END FOR MUTUAL CAPACITANCE SENSING AND SE...
Publication number
20140078096
Publication date
Mar 20, 2014
STMicroelectronics Asia Pacific Pte. Ltd.
Kien Beng Tan
G01 - MEASURING TESTING
Information
Patent Application
HIGH SIGNAL TO NOISE RATIO CAPACITIVE SENSING ANALOG FRONT-END
Publication number
20140077823
Publication date
Mar 20, 2014
STMicroelectronics Asia Pacific Pte. Ltd.
Paolo Angelini
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR TESTING A MICROELECTROMECHANICAL DEVICE, AND MICROELECTR...
Publication number
20110023605
Publication date
Feb 3, 2011
STMicroelectronics S.r.l.
Giovanni Carlo Tripoli
G01 - MEASURING TESTING