Giovanni Ferrara

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Integrated defect detection and location systems and methods in sem...
- Patent number 10,168,387
- Issue date Jan 1, 2019
- Infineon Technologies Austria AG
- Cheow Guan Lim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED DEFECT DETECTION AND LOCATION SYSTEMS AND METHODS IN SEM...
- Publication number 20140013171
- Publication date Jan 9, 2014
- Cheow Guan Lim
- G01 - MEASURING TESTING