Girish A. Patankar

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Layout-aware test pattern generation and fault detection
- Patent number 11,237,210
- Issue date Feb 1, 2022
- Synopsys, Inc.
- Alodeep Sanyal
- G01 - MEASURING TESTING
Information Patent Grant
Layout-aware test pattern generation and fault detection
- Patent number 10,254,343
- Issue date Apr 9, 2019
- Synopsys, Inc.
- Alodeep Sanyal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LAYOUT-AWARE TEST PATTERN GENERATION AND FAULT DETECTION
- Publication number 20140032156
- Publication date Jan 30, 2014
- Synopsys, Inc.
- Alodeep Sanyal
- G01 - MEASURING TESTING