Girish Bal

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Niskayuna, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for evaluating operation of pixelated detectors
- Patent number 8,158,951
- Issue date Apr 17, 2012
- General Electric Company
- Girish Bal
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for determining a system matrix for pinhole c...
- Patent number 7,829,856
- Issue date Nov 9, 2010
- General Electric Company
- Floribertus Heukensfeldt Jansen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHODS FOR DETERMINING A SYSTEM MATRIX FOR PINHOLE C...
- Publication number 20100243907
- Publication date Sep 30, 2010
- Floribertus Heukensfeldt Jansen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHODS FOR EVALUATING OPERATION OF PIXELATED DETECTORS
- Publication number 20100193697
- Publication date Aug 5, 2010
- Girish Bal
- G01 - MEASURING TESTING