Giuseppe AMELIO

Person

San Pietro (LU), IT

People

Patents Applicationslast 30 patents

Information Patent Application
Burn-In Station for Performing Burn-In Testing of Electronic Devices
- Publication number 20250138083
- Publication date May 1, 2025
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD WITH VERTICAL PROBES FOR A PROBE CARD AND CORRESPONDIN...
- Publication number 20250123308
- Publication date Apr 17, 2025
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
SHELL FOR WAFER LEVEL BURN-IN (WLBI) CHIP TEST, METHOD FOR LOADING...
- Publication number 20250093405
- Publication date Mar 20, 2025
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
Probe-holder support and corresponding probes with facilitated moun...
- Publication number 20240353481
- Publication date Oct 24, 2024
- Microtest S.p.A.
- Giuseppe Amelio
- G01 - MEASURING TESTING
Information Patent Application
Method and System of Developing and Executing Test Program for Veri...
- Publication number 20240337683
- Publication date Oct 10, 2024
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE ELEMENT WITH ELASTIC PROPERTIES PROVIDED WITH INTERNAL EL...
- Publication number 20240183900
- Publication date Jun 6, 2024
- Microtest S.p.A.
- Giuseppe AMELIO
- G01 - MEASURING TESTING
Information Patent Application
Probe head for wafer-level burn-in test (WLBI) and probe card compr...
- Publication number 20240183882
- Publication date Jun 6, 2024
- Microsoft S.p.A
- Giuseppe AMELIO
- G01 - MEASURING TESTING

Giuseppe AMELIO

Person

Patents Applicationslast 30 patents

Burn-In Station for Performing Burn-In Testing of Electronic Devices

TESTING HEAD WITH VERTICAL PROBES FOR A PROBE CARD AND CORRESPONDIN...

SHELL FOR WAFER LEVEL BURN-IN (WLBI) CHIP TEST, METHOD FOR LOADING...

Probe-holder support and corresponding probes with facilitated moun...

Method and System of Developing and Executing Test Program for Veri...

INTERFACE ELEMENT WITH ELASTIC PROPERTIES PROVIDED WITH INTERNAL EL...

Probe head for wafer-level burn-in test (WLBI) and probe card compr...