Giuseppe Crippa

Person

Merate, IT

People

Patents Grantslast 30 patents

Information Patent Grant
Contact probe for testing head
- Patent number 11,131,690
- Issue date Sep 28, 2021
- Technoprobe S.p.A.
- Giuseppe Crippa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card for a testing apparatus of electronic devices, particula...
- Patent number 10,509,056
- Issue date Dec 17, 2019
- Technoprobe S.p.A.
- Riccardo Liberini
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of a semi-finished product comprising a plural...
- Patent number 10,365,299
- Issue date Jul 30, 2019
- Technoprobe S.p.A.
- Giuseppe Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for a testing head
- Patent number 10,228,392
- Issue date Mar 12, 2019
- Technoprobe S.p.A.
- Roberto Crippa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe for a testing head having vertical probes for semicon...
- Patent number 7,301,354
- Issue date Nov 27, 2007
- Technoprobe S.p.A.
- Giuseppe Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Testing head contact probe with an eccentric contact tip
- Patent number 7,227,368
- Issue date Jun 5, 2007
- Technoprobe S.p.A.
- Giuseppe Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having vertical probes for semiconductor integrated el...
- Patent number 6,768,327
- Issue date Jul 27, 2004
- Technoprobe S.r.l.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having cantilever probes
- Patent number 6,674,298
- Issue date Jan 6, 2004
- Technoprobe S.r.l.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Grant
Microstructure testing head
- Patent number 6,515,496
- Issue date Feb 4, 2003
- Technoprobe S.r.l.
- Stefano Felici
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT PROBE FOR TESTING HEAD
- Publication number 20170307657
- Publication date Oct 26, 2017
- Technoprobe S.p.A.
- Giuseppe Crippa
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD OF A SEMI-FINISHED PRODUCT COMPRISING A PLURAL...
- Publication number 20170299634
- Publication date Oct 19, 2017
- Technoprobe S.p.A.
- Giuseppe Crippa
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR A TESTING HEAD
- Publication number 20170269125
- Publication date Sep 21, 2017
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR A TESTING HEAD
- Publication number 20170059612
- Publication date Mar 2, 2017
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES, PARTICULA...
- Publication number 20160377656
- Publication date Dec 29, 2016
- Technoprobe S.p.A.
- Riccardo Liberini
- G01 - MEASURING TESTING
Information Patent Application
Contact probe for a testing head
- Publication number 20050270044
- Publication date Dec 8, 2005
- Technoprobe S.p.A.
- Giuseppe Crippa
- G01 - MEASURING TESTING
Information Patent Application
Contact probe for a testing head having vertical probes for semicon...
- Publication number 20050110506
- Publication date May 26, 2005
- Technoprobe S.p.A.
- Giuseppe Crippa
- G01 - MEASURING TESTING
Information Patent Application
Contact probe for a testing head
- Publication number 20030151419
- Publication date Aug 14, 2003
- Technoprobe S.r.l.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Application
Testing head having vertical probes for semiconductor integrated el...
- Publication number 20020153910
- Publication date Oct 24, 2002
- Technoprobe S.r.I.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Application
Testing head having vertical probes
- Publication number 20020070743
- Publication date Jun 13, 2002
- Technoprobe S.r.l.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Application
Testing head having cantilever probes
- Publication number 20020067178
- Publication date Jun 6, 2002
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Application
Microstructure testing head
- Publication number 20020024347
- Publication date Feb 28, 2002
- Stefano Felici
- G01 - MEASURING TESTING

Giuseppe Crippa

Person

Patents Grantslast 30 patents

Contact probe for testing head

Probe card for a testing apparatus of electronic devices, particula...

Manufacturing method of a semi-finished product comprising a plural...

Contact probe for a testing head

Contact probe for a testing head having vertical probes for semicon...

Testing head contact probe with an eccentric contact tip

Testing head having vertical probes for semiconductor integrated el...

Testing head having cantilever probes

Microstructure testing head

Patents Applicationslast 30 patents

CONTACT PROBE FOR TESTING HEAD

MANUFACTURING METHOD OF A SEMI-FINISHED PRODUCT COMPRISING A PLURAL...

CONTACT PROBE FOR A TESTING HEAD

CONTACT PROBE FOR A TESTING HEAD

PROBE CARD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES, PARTICULA...

Contact probe for a testing head

Contact probe for a testing head having vertical probes for semicon...

Contact probe for a testing head

Testing head having vertical probes for semiconductor integrated el...

Testing head having vertical probes

Testing head having cantilever probes

Microstructure testing head