Giuseppe Pavia

Person

Aalen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam system and method
- Patent number 10,854,421
- Issue date Dec 1, 2020
- Carl Zeiss Microscopy GmbH
- Daniela Donhauser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating a particle beam generator for a particle beam...
- Patent number 10,763,076
- Issue date Sep 1, 2020
- Carl Zeiss Microscopy GmbH
- Giuseppe Pavia
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method of generating a zoom sequence and microscope system configur...
- Patent number 10,468,229
- Issue date Nov 5, 2019
- Carl Zeiss Microscopy GmbH
- Giuseppe Pavia
- G02 - OPTICS
Information Patent Grant
Method of determining crystallographic properties of a sample and e...
- Patent number 10,319,560
- Issue date Jun 11, 2019
- Carl Zeiss Microscopy GmbH
- Giuseppe Pavia
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM GENERATOR FOR A PARTICLE BEAM...
- Publication number 20190355551
- Publication date Nov 21, 2019
- CARL ZEISS MICROSCOPY GMBH
- Giuseppe Pavia
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD
- Publication number 20190304743
- Publication date Oct 3, 2019
- CARL ZEISS MICROSCOPY GMBH
- Daniela Donhauser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING CRYSTALLOGRAPHIC PROPERTIES OF A SAMPLE AND E...
- Publication number 20170025249
- Publication date Jan 26, 2017
- CARL ZEISS MICROSCOPY GMBH
- Giuseppe Pavia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF GENERATING A ZOOM SEQUENCE AND MICROSCOPE SYSTEM CONFIGUR...
- Publication number 20160284507
- Publication date Sep 29, 2016
- CARL ZEISS MICROSCOPY GMBH
- Giuseppe Pavia
- G02 - OPTICS
Information Patent Application
METHOD FOR PREPARING AND ANALYZING AN OBJECT AS WELL AS PARTICLE BE...
- Publication number 20150214004
- Publication date Jul 30, 2015
- CARL ZEISS MICROSCOPY GMBH
- Giuseppe Pavia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR SETTING AN OPERATING PARAMETER OF A PARTICLE BEAM DEVICE...
- Publication number 20130234011
- Publication date Sep 12, 2013
- Harald Niebel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for setting an operating parameter of a particle beam device...
- Publication number 20100230584
- Publication date Sep 16, 2010
- Harald Niebel
- H01 - BASIC ELECTRIC ELEMENTS

Giuseppe Pavia

Person

Patents Grantslast 30 patents

Charged particle beam system and method

Method for operating a particle beam generator for a particle beam...

Method of generating a zoom sequence and microscope system configur...

Method of determining crystallographic properties of a sample and e...

Patents Applicationslast 30 patents

METHOD FOR OPERATING A PARTICLE BEAM GENERATOR FOR A PARTICLE BEAM...

CHARGED PARTICLE BEAM SYSTEM AND METHOD

METHOD OF DETERMINING CRYSTALLOGRAPHIC PROPERTIES OF A SAMPLE AND E...

METHOD OF GENERATING A ZOOM SEQUENCE AND MICROSCOPE SYSTEM CONFIGUR...

METHOD FOR PREPARING AND ANALYZING AN OBJECT AS WELL AS PARTICLE BE...

METHOD FOR SETTING AN OPERATING PARAMETER OF A PARTICLE BEAM DEVICE...

Method for setting an operating parameter of a particle beam device...