Glen Gilfeather

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional tomography
- Patent number 7,088,852
- Issue date Aug 8, 2006
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Laser beam induced phenomena detection
- Patent number 6,897,664
- Issue date May 24, 2005
- Advanced Micro Devices, Inc.
- Michael Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optic semiconductor analysis arrangement and method therefor
- Patent number 6,844,928
- Issue date Jan 18, 2005
- Advanced Micro Devices, Inc.
- Glen P. Gilfeather
- G01 - MEASURING TESTING
Information Patent Grant
Photon beacon
- Patent number 6,833,718
- Issue date Dec 21, 2004
- Advanced Micro Devices, Inc.
- David Bethke
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis for SOI integrated circuits
- Patent number 6,716,683
- Issue date Apr 6, 2004
- Advanced Mircor Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor analysis arrangement and method therefor
- Patent number 6,700,659
- Issue date Mar 2, 2004
- Advanced Micro Devices, Inc.
- Srikar V. Chunduri
- G01 - MEASURING TESTING
Information Patent Grant
Constant-current VDDQ testing of integrated circuits
- Patent number 6,661,246
- Issue date Dec 9, 2003
- Advanced Micro Devices, Inc.
- Glen Patrick Gilfeather
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor analysis arrangement and method therefor
- Patent number 6,635,839
- Issue date Oct 21, 2003
- Advanced Micro Devices, Inc.
- Glen P. Gilfeather
- G01 - MEASURING TESTING
Information Patent Grant
Repair of resistive electrical connections in an integrated circuit
- Patent number 6,566,888
- Issue date May 20, 2003
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for metal stack thermal management in semiconductor devices
- Patent number 6,518,661
- Issue date Feb 11, 2003
- Advanced Micro Devices, Inc.
- Richard C. Blish
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Time-resolved emission microscopy system
- Patent number 6,469,529
- Issue date Oct 22, 2002
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Probe grid for integrated circuit analysis
- Patent number 6,455,334
- Issue date Sep 24, 2002
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for characterization of focused-ion-beam ins...
- Patent number 6,372,627
- Issue date Apr 16, 2002
- Advanced Micro Devices, Inc.
- Rosalinda M. Ring
- G01 - MEASURING TESTING
Information Patent Grant
Probe grid for integrated circuit excitation
- Patent number 6,352,871
- Issue date Mar 5, 2002
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Endpoint detection for thinning of silicon of a flip chip bonded in...
- Patent number 6,285,036
- Issue date Sep 4, 2001
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Method for bringing up lower level metal nodes of multi-layered int...
- Patent number 6,171,944
- Issue date Jan 9, 2001
- Advanced Micro Devices, Inc.
- Xia Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Endpoint detection for thinning of silicon of a flip chip bonded in...
- Patent number 6,069,366
- Issue date May 30, 2000
- Advanced Micro Devices, Inc.
- Rama R. Goruganthu
- G01 - MEASURING TESTING
Information Patent Grant
Device analysis for face down chip
- Patent number 5,972,725
- Issue date Oct 26, 1999
- Advanced Micro Devices, Inc.
- Donald L. Wollesen
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic discharge protection circuitry for any two external p...
- Patent number 4,870,530
- Issue date Sep 26, 1989
- Advanced Micro Devices, Inc.
- Roger S. Hurst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Protection system for CMOS integrated circuits
- Patent number 4,819,047
- Issue date Apr 4, 1989
- Advanced Micro Devices, Inc.
- Glen Gilfeather
- H01 - BASIC ELECTRIC ELEMENTS

Glen Gilfeather

Person

Patents Grantslast 30 patents

Three-dimensional tomography

Laser beam induced phenomena detection

Fiber optic semiconductor analysis arrangement and method therefor

Photon beacon

Optical analysis for SOI integrated circuits

Semiconductor analysis arrangement and method therefor

Constant-current VDDQ testing of integrated circuits

Semiconductor analysis arrangement and method therefor

Repair of resistive electrical connections in an integrated circuit

Apparatus for metal stack thermal management in semiconductor devices

Time-resolved emission microscopy system

Probe grid for integrated circuit analysis

Method and arrangement for characterization of focused-ion-beam ins...

Probe grid for integrated circuit excitation

Endpoint detection for thinning of silicon of a flip chip bonded in...

Method for bringing up lower level metal nodes of multi-layered int...

Endpoint detection for thinning of silicon of a flip chip bonded in...

Device analysis for face down chip

Electrostatic discharge protection circuitry for any two external p...

Protection system for CMOS integrated circuits