Glen W. Scheid

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Gresham, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for using tool state information to identify f...
- Patent number 6,738,731
- Issue date May 18, 2004
- Advanced Micro Devices, Inc.
- Terrence J. Riley
- G01 - MEASURING TESTING
Information Patent Grant
Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization
- Patent number 6,268,270
- Issue date Jul 31, 2001
- Advanced Micro Devices, Inc.
- Glen W. Scheid
- G01 - MEASURING TESTING