Glendon P. Marston

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Manchester, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor material characterizing method and apparatus
- Patent number 6,163,163
- Issue date Dec 19, 2000
- Semitest, Inc.
- Charles M. Kohn
Information Patent Grant
Method and apparatus for characterizing a specimen of semiconductor...
- Patent number 6,097,205
- Issue date Aug 1, 2000
- Semitest, Inc.
- Sergey Liberman
- G01 - MEASURING TESTING
Information Patent Grant
Method utilizing a modulated light beam for determining characteris...
- Patent number 6,034,535
- Issue date Mar 7, 2000
- Semitest Inc.
- Sergey Liberman
- G01 - MEASURING TESTING
Information Patent Grant
Programmable computer terminal system
- Patent number 4,281,393
- Issue date Jul 28, 1981
- Computek, Inc.
- Ephraim Gitelman
- G06 - COMPUTING CALCULATING COUNTING