Glenn E. Schuette

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Allen, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Key distribution
- Patent number 7,853,640
- Issue date Dec 14, 2010
- Texas Instruments Incorporated
- Glenn E. Schuette
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for resumed probing of a wafer
- Patent number 7,323,899
- Issue date Jan 29, 2008
- Texas Instruments Incorporated
- Glenn E. Schuette
- G01 - MEASURING TESTING
Information Patent Grant
System and method for the probing of a wafer
- Patent number 7,148,716
- Issue date Dec 12, 2006
- Texas Instruments Incorporated
- Glenn E. Schuette
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Fail Density-Based Clustering for Yield Loss Detection
- Publication number 20210181253
- Publication date Jun 17, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Istvan Bauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for the Probing of a Wafer
- Publication number 20070080705
- Publication date Apr 12, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Glenn E. Schuette
- G01 - MEASURING TESTING
Information Patent Application
System and method for the probing of a wafer
- Publication number 20050275421
- Publication date Dec 15, 2005
- Glenn E. Schuette
- G01 - MEASURING TESTING
Information Patent Application
Key Distribution
- Publication number 20050055671
- Publication date Mar 10, 2005
- Glenn E. Schuette
- H04 - ELECTRIC COMMUNICATION TECHNIQUE