Go Fujinawa

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Hamura, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray diffraction measuring apparatus having debye-scherrer optical...
- Patent number 7,860,217
- Issue date Dec 28, 2010
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray optical system
- Patent number 7,542,548
- Issue date Jun 2, 2009
- Rigaku Corp.
- Ryuji Matsuo
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray optical system for small angle scattering
- Patent number 6,990,177
- Issue date Jan 24, 2006
- Rigaku Corporation
- Go Fujinawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for making parallel X-ray beam and X-ray diffr...
- Patent number 6,917,667
- Issue date Jul 12, 2005
- Rigaku Corporation
- Go Fujinawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray diffraction apparatus
- Patent number 6,807,251
- Issue date Oct 19, 2004
- Rigaku Corporation
- Hitoshi Okanda
- G01 - MEASURING TESTING
Information Patent Grant
Soller slit and X-ray apparatus
- Patent number 6,307,917
- Issue date Oct 23, 2001
- Rigaku Corporation
- Katsuhiko Shimizu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Soller slit and manufacturing method of the same
- Patent number 6,266,392
- Issue date Jul 24, 2001
- Rigaku Corporation
- Go Fujinawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
X-Ray Diffraction Measuring Apparatus Having Debye-Scherrer Optical...
- Publication number 20090086910
- Publication date Apr 2, 2009
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Application
X-ray optical system
- Publication number 20080084967
- Publication date Apr 10, 2008
- Rigaku Corporation
- Ryuji Matsuo
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray optical system for small angle scattering
- Publication number 20040066903
- Publication date Apr 8, 2004
- Rigaku Corporation
- Go Fujinawa
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for taking parallel X-ray beam and X-ray diffr...
- Publication number 20040066896
- Publication date Apr 8, 2004
- Rigaku Corporation
- Go Fujinawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray diffraction apparatus
- Publication number 20030123610
- Publication date Jul 3, 2003
- Rigaku Corporation
- Hitoshi Okanda
- G01 - MEASURING TESTING