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Go Matsunobu
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Kanagawa, JP
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last 30 patents
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Patent Grant
Method of forming semiconductor thin film and semiconductor thin fi...
Patent number
8,193,008
Issue date
Jun 5, 2012
Sony Corporation
Nobuhiko Umezu
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
METHOD OF FORMING SEMICONDUCTOR THIN FILM AND SEMICONDUCTOR THIN FI...
Publication number
20120231559
Publication date
Sep 13, 2012
SONY CORPORATION
Nobuhiko Umezu
G01 - MEASURING TESTING
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Patent Application
METHOD OF FORMING SEMICONDUCTOR THIN FILM AND SEMICONDUCTOR THIN FI...
Publication number
20090291511
Publication date
Nov 26, 2009
SONY CORPORATION
Nobuhiko Umezu
G01 - MEASURING TESTING