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Yokkaichi-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Evaluation method for polycrystalline silicon
- Patent number 6,916,657
- Issue date Jul 12, 2005
- Mitsubishi Materials Silicon Corporation
- Kenji Hori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Evaluation method for polycrystalline silicon
- Publication number 20020000186
- Publication date Jan 3, 2002
- Kenji Hori
- C30 - CRYSTAL GROWTH