Go UTAMARU

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Ibaraki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 12,130,324
- Issue date Oct 29, 2024
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 11,800,619
- Issue date Oct 24, 2023
- Advantest Corporation
- Kotaro Hasegawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test apparatus, test method, and computer-readable storage medium
- Patent number 11,788,885
- Issue date Oct 17, 2023
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for determining pass or fail of LEDs, test method an...
- Patent number 11,293,966
- Issue date Apr 5, 2022
- Advantest Corporation
- Kotaro Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
PLL circuit
- Patent number 8,710,881
- Issue date Apr 29, 2014
- Advantest Corporation
- Go Utamaru
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Modulation apparatus, test apparatus and correction method
- Patent number 8,406,283
- Issue date Mar 26, 2013
- Advantest Corporation
- Go Utamaru
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Signal generation apparatus and test apparatus
- Patent number 8,207,765
- Issue date Jun 26, 2012
- Advantest Corporation
- Go Utamaru
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20220276090
- Publication date Sep 1, 2022
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20220232685
- Publication date Jul 21, 2022
- Advantest Corporation
- Kotaro HASEGAWA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20220221504
- Publication date Jul 14, 2022
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD AND COMPUTER-READABLE MEDIUM
- Publication number 20200379029
- Publication date Dec 3, 2020
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
PLL CIRCUIT
- Publication number 20110018598
- Publication date Jan 27, 2011
- Advantest Corporation
- Go UTAMARU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MODULATION APPARATUS, TEST APPARATUS AND CORRECTION METHOD
- Publication number 20110013682
- Publication date Jan 20, 2011
- Advantest Corporation
- Go UTAMARU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SIGNAL GENERATION APPARATUS AND TEST APPARATUS
- Publication number 20110012659
- Publication date Jan 20, 2011
- Advantest Corporation
- Go UTAMARU
- H03 - BASIC ELECTRONIC CIRCUITRY

Person

Patents Grantslast 30 patents

Test apparatus, test method, and computer-readable storage medium

Test apparatus, test method, and computer-readable storage medium

Test apparatus, test method, and computer-readable storage medium

Test apparatus for determining pass or fail of LEDs, test method an...

PLL circuit

Modulation apparatus, test apparatus and correction method

Signal generation apparatus and test apparatus

Patents Applicationslast 30 patents

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

TEST APPARATUS, TEST METHOD AND COMPUTER-READABLE MEDIUM

PLL CIRCUIT

MODULATION APPARATUS, TEST APPARATUS AND CORRECTION METHOD

SIGNAL GENERATION APPARATUS AND TEST APPARATUS