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Ibaraki, JP
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last 30 patents
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Patent Grant
Test apparatus, test method, and computer-readable storage medium
Patent number
11,800,619
Issue date
Oct 24, 2023
Advantest Corporation
Kotaro Hasegawa
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Test apparatus, test method, and computer-readable storage medium
Patent number
11,788,885
Issue date
Oct 17, 2023
Advantest Corporation
Kotaro Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus for determining pass or fail of LEDs, test method an...
Patent number
11,293,966
Issue date
Apr 5, 2022
Advantest Corporation
Kotaro Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
PLL circuit
Patent number
8,710,881
Issue date
Apr 29, 2014
Advantest Corporation
Go Utamaru
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Modulation apparatus, test apparatus and correction method
Patent number
8,406,283
Issue date
Mar 26, 2013
Advantest Corporation
Go Utamaru
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Signal generation apparatus and test apparatus
Patent number
8,207,765
Issue date
Jun 26, 2012
Advantest Corporation
Go Utamaru
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
Publication number
20220276090
Publication date
Sep 1, 2022
Advantest Corporation
Kotaro HASEGAWA
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
Publication number
20220232685
Publication date
Jul 21, 2022
Advantest Corporation
Kotaro HASEGAWA
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
Publication number
20220221504
Publication date
Jul 14, 2022
Advantest Corporation
Kotaro HASEGAWA
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS, TEST METHOD AND COMPUTER-READABLE MEDIUM
Publication number
20200379029
Publication date
Dec 3, 2020
Advantest Corporation
Kotaro HASEGAWA
G01 - MEASURING TESTING
Information
Patent Application
PLL CIRCUIT
Publication number
20110018598
Publication date
Jan 27, 2011
Advantest Corporation
Go UTAMARU
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
MODULATION APPARATUS, TEST APPARATUS AND CORRECTION METHOD
Publication number
20110013682
Publication date
Jan 20, 2011
Advantest Corporation
Go UTAMARU
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SIGNAL GENERATION APPARATUS AND TEST APPARATUS
Publication number
20110012659
Publication date
Jan 20, 2011
Advantest Corporation
Go UTAMARU
H03 - BASIC ELECTRONIC CIRCUITRY