Goel Sandeepkumar

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Testing of an integrated circuit that contains secret information
- Patent number 8,539,292
- Issue date Sep 17, 2013
- NXP B.V.
- André K. Nieuwland
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING OF AN INTEGRATED CIRCUIT THAT CONTAINS SECRET INFORMATION
- Publication number 20100264932
- Publication date Oct 21, 2010
- NXP B.V.
- Erik Jan Marinissen
- G01 - MEASURING TESTING
Information Patent Application
TESTABLE INTEGRATED CIRCUIT AND IC TEST METHOD
- Publication number 20100231252
- Publication date Sep 16, 2010
- NXP B.V.
- Sandeepkumar Goel
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF AN INTEGRATED CIRCUIT THAT CONTAINS SECRET INFORMATION
- Publication number 20100223515
- Publication date Sep 2, 2010
- NXP B.V.
- Andre Krijn Nieuwland
- G01 - MEASURING TESTING
Information Patent Application
TEST PREPARED INTEGRATED CIRCUIT WITH AN INTERNAL POWER SUPPLY DOMAIN
- Publication number 20100013493
- Publication date Jan 21, 2010
- NXP B.V.
- Rinze I. M. P. Meijer
- G01 - MEASURING TESTING