Gokhan Percin

Person

Los Gatos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integration of structurally-stable isolated capacitive micromachine...
- Patent number 8,563,345
- Issue date Oct 22, 2013
- National Semiconductor Corporated
- Steven J. Adler
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
System and method for calibrating a lithography model
- Patent number 8,279,409
- Issue date Oct 2, 2012
- Cadence Design Systems, Inc.
- Abdurrahman Sezginer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for forming a capacitive micromachined ultrasonic...
- Patent number 8,222,065
- Issue date Jul 17, 2012
- National Semiconductor Corporation
- Peter Smeys
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Method of compensating photomask data for the effects of etch and l...
- Patent number 7,600,212
- Issue date Oct 6, 2009
- Cadence Design Systems, Inc.
- Franz X. Zach
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for reducing the impact of across-wafer variation...
- Patent number 7,588,868
- Issue date Sep 15, 2009
- Cadence Design Systems, Inc.
- Franz X. Zach
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for verifying and choosing lithography model
- Patent number 7,536,670
- Issue date May 19, 2009
- Cadence Design Systems, Inc.
- Gökhan Perçin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Calibration on wafer sweet spots
- Patent number 7,444,615
- Issue date Oct 28, 2008
- Invarium, Inc.
- Gokhan Percin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for real time monitoring and verifying optical proximity cor...
- Patent number 7,392,502
- Issue date Jun 24, 2008
- Invarium, Inc.
- Gökhan Percin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for measuring and verifying stepper illumination
- Patent number 7,224,437
- Issue date May 29, 2007
- Invarium, Inc.
- Gökhan Perçin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATION OF STRUCTURALLY-STABLE ISOLATED CAPACITIVE MICROMACHINE...
- Publication number 20120187508
- Publication date Jul 26, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Steven J. Adler
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
Method of compensating photomask data for the effects of etch and l...
- Publication number 20070143733
- Publication date Jun 21, 2007
- Invarium, Inc.
- Franz X. Zach
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for real time monitoring and verifying optical proximity cor...
- Publication number 20070006116
- Publication date Jan 4, 2007
- Invarium Inc.
- Gokhan Percin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for verifying and choosing lithography model
- Publication number 20060282814
- Publication date Dec 14, 2006
- Invarium, Inc.
- Gokhan Percin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Calibration on wafer sweet spots
- Publication number 20060266243
- Publication date Nov 30, 2006
- Invarium Inc.
- Gokhan Percin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for measuring and verifying stepper illumination
- Publication number 20060268254
- Publication date Nov 30, 2006
- Invarium, Inc.
- Gokhan Percin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and system for reducing the impact of across-wafer variation...
- Publication number 20060073686
- Publication date Apr 6, 2006
- Franz X. Zach
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Gokhan Percin

Person

Patents Grantslast 30 patents

Integration of structurally-stable isolated capacitive micromachine...

System and method for calibrating a lithography model

Method and system for forming a capacitive micromachined ultrasonic...

Method of compensating photomask data for the effects of etch and l...

Method and system for reducing the impact of across-wafer variation...

Method for verifying and choosing lithography model

Calibration on wafer sweet spots

Method for real time monitoring and verifying optical proximity cor...

Method for measuring and verifying stepper illumination

Patents Applicationslast 30 patents

INTEGRATION OF STRUCTURALLY-STABLE ISOLATED CAPACITIVE MICROMACHINE...

Method of compensating photomask data for the effects of etch and l...

Method for real time monitoring and verifying optical proximity cor...

Method for verifying and choosing lithography model

Calibration on wafer sweet spots

Method for measuring and verifying stepper illumination

Method and system for reducing the impact of across-wafer variation...