Gonzalo Roberto SANGUINETTI

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of determining information about a patterning process, metho...
- Patent number 11,604,419
- Issue date Mar 14, 2023
- ASML Netherlands B.V.
- Joannes Jitse Venselaar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology parameter determination and metrology recipe selection
- Patent number 11,448,974
- Issue date Sep 20, 2022
- ASML Netherlands B.V.
- Narjes Javaheri
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of determining information about a patterning process, metho...
- Patent number 11,022,897
- Issue date Jun 1, 2021
- ASML Netherlands B.V.
- Joannes Jitse Venselaar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology parameter determination and metrology recipe selection
- Patent number 10,990,020
- Issue date Apr 27, 2021
- ASML Netherlands B.V.
- Narjes Javaheri
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a structure, inspection apparatus, lithographic...
- Patent number 10,859,923
- Issue date Dec 8, 2020
- ASML Netherlands B.V.
- Gonzalo Roberto Sanguinetti
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a parameter of interest, inspection apparatus,...
- Patent number 10,705,430
- Issue date Jul 7, 2020
- ASML Netherlands B.V.
- Gonzalo Roberto Sanguinetti
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of measuring a structure, inspection apparatus, lithographic...
- Patent number 10,564,552
- Issue date Feb 18, 2020
- ASML Netherlands B.V.
- Gonzalo Roberto Sanguinetti
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHO...
- Publication number 20210255552
- Publication date Aug 19, 2021
- ASML NETHERLANDS B.V.
- Joannes Jitse VENSELAAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION
- Publication number 20210208513
- Publication date Jul 8, 2021
- ASML NETHERLANDS B.V.
- Narjes JAVAHERI
- G01 - MEASURING TESTING
Information Patent Application
Method of Measuring a Structure, Inspection Apparatus, Lithographic...
- Publication number 20200183290
- Publication date Jun 11, 2020
- ASML NETHERLANDS B.V.
- Gonzalo Roberto SANGUINETTI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHO...
- Publication number 20190171115
- Publication date Jun 6, 2019
- ASML NETHERLANDS B.V.
- Joannes Jitse VENSELAAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method Of Measuring a Structure, Inspection Apparatus, Lithographic...
- Publication number 20180373166
- Publication date Dec 27, 2018
- ASML NETHERLANDS B.V.
- Gonzalo Roberto SANGUINETTI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MEASURING A PARAMETER OF INTEREST, INSPECTION APPARATUS,...
- Publication number 20180341182
- Publication date Nov 29, 2018
- ASML NETHERLANDS B.V.
- Gonzalo Roberto SANGUINETTI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION
- Publication number 20180321597
- Publication date Nov 8, 2018
- ASML NETHERLANDS B.V.
- Narjes JAVAHERI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Gonzalo Roberto SANGUINETTI

Person

Patents Grantslast 30 patents

Method of determining information about a patterning process, metho...

Metrology parameter determination and metrology recipe selection

Method of determining information about a patterning process, metho...

Metrology parameter determination and metrology recipe selection

Method of measuring a structure, inspection apparatus, lithographic...

Method of measuring a parameter of interest, inspection apparatus,...

Method of measuring a structure, inspection apparatus, lithographic...

Patents Applicationslast 30 patents

METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHO...

METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION

Method of Measuring a Structure, Inspection Apparatus, Lithographic...

METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHO...

Method Of Measuring a Structure, Inspection Apparatus, Lithographic...

METHOD OF MEASURING A PARAMETER OF INTEREST, INSPECTION APPARATUS,...

METROLOGY PARAMETER DETERMINATION AND METROLOGY RECIPE SELECTION