Goon Heng WONG

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Tualath, OR, US

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Patents Applicationslast 30 patents

Information Patent Application
IN-SITU WAFER THICKNESS AND GAP MONITORING USING THROUGH BEAM LASER...
- Publication number 20240210163
- Publication date Jun 27, 2024
- LAM RESEARCH CORPORATION
- Goon Heng WONG
- G01 - MEASURING TESTING
Information Patent Application
FRONTSIDE AND BACKSIDE PRESSURE MONITORING FOR SUBSTRATE MOVEMENT P...
- Publication number 20230141653
- Publication date May 11, 2023
- LAM RESEARCH CORPORATION
- Songqi GAO
- H01 - BASIC ELECTRIC ELEMENTS