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Gopalakrishnan Perur Krishnan
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Bangalore, IN
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Patents Grants
last 30 patents
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Patent Grant
Programmable address space built-in self test (BIST) device and met...
Patent number
7,945,823
Issue date
May 17, 2011
Netlogic Microsystems, Inc.
Ramesha Doddamane
G11 - INFORMATION STORAGE
Information
Patent Grant
Signal averaging circuit and method for sample averaging
Patent number
7,765,251
Issue date
Jul 27, 2010
Cypress Semiconductor Corporation
Yansun Xu
G01 - MEASURING TESTING
Information
Patent Grant
Parallel input/output self-test circuit and method
Patent number
7,447,958
Issue date
Nov 4, 2008
Cypress Semiconductor Corporation
Gopalakrishnan Perur Krishnan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Programmable address space built-in self test (BIST) device and met...
Publication number
20070271482
Publication date
Nov 22, 2007
Ramesha Doddamane
G11 - INFORMATION STORAGE
Information
Patent Application
Signal averaging circuit and method for sample averaging
Publication number
20070143383
Publication date
Jun 21, 2007
Silicon Light Machines Corporation
Yansun Xu
G01 - MEASURING TESTING
Information
Patent Application
Parallel input/output self-test circuit and method
Publication number
20060253752
Publication date
Nov 9, 2006
Gopalakrishnan Perur Krishnan
G01 - MEASURING TESTING